Dynamic Element Matching Techniques for Static and Dynamic Errors in Continuous-Time Multi-Bit ΔΣ Modulators

Arindam Sanyal; Nan Sun

doi:10.1109/JETCAS.2015.2502160

Dynamic Element Matching Techniques for Static and Dynamic Errors in Continuous-Time Multi-Bit ΔΣ Modulators

Arindam Sanyal, Nan Sun

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

This paper presents techniques to address static and dynamic errors in high performance continuous-time (CT), ΔΣ modulators. The inter-symbol interference (ISI) model is presented and existing ISI reduction techniques are reviewed. A novel technique has been presented which can high-pass shape both static mismatch and ISI error of each element of a multi-bit DAC while decorrelating the instantaneous number of transitions from the input signal. The proposed technique can easily be extended to higher order shaping for both static mismatch and ISI errors. Simulation results show that the proposed technique can improve DAC linearity significantly in presence of both static mismatch and ISI error.

Original language	English (US)
Article number	7347463
Pages (from-to)	598-611
Number of pages	14
Journal	IEEE Journal on Emerging and Selected Topics in Circuits and Systems
Volume	5
Issue number	4
DOIs	https://doi.org/10.1109/JETCAS.2015.2502160
State	Published - Dec 2015
Externally published	Yes

Keywords

Analog-to-digital converter (ADC)
device mismatch
digital-to-analog converter (DAC)
dynamic element matching
dynamic error
inter-symbol interference (ISI)
mismatch shaping
thermometer coding
ΔΣ modulator

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1109/JETCAS.2015.2502160

Cite this

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title = "Dynamic Element Matching Techniques for Static and Dynamic Errors in Continuous-Time Multi-Bit ΔΣ Modulators",

abstract = "This paper presents techniques to address static and dynamic errors in high performance continuous-time (CT), ΔΣ modulators. The inter-symbol interference (ISI) model is presented and existing ISI reduction techniques are reviewed. A novel technique has been presented which can high-pass shape both static mismatch and ISI error of each element of a multi-bit DAC while decorrelating the instantaneous number of transitions from the input signal. The proposed technique can easily be extended to higher order shaping for both static mismatch and ISI errors. Simulation results show that the proposed technique can improve DAC linearity significantly in presence of both static mismatch and ISI error.",

keywords = "Analog-to-digital converter (ADC), device mismatch, digital-to-analog converter (DAC), dynamic element matching, dynamic error, inter-symbol interference (ISI), mismatch shaping, thermometer coding, ΔΣ modulator",

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AU - Sanyal, Arindam

AU - Sun, Nan

PY - 2015/12

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N2 - This paper presents techniques to address static and dynamic errors in high performance continuous-time (CT), ΔΣ modulators. The inter-symbol interference (ISI) model is presented and existing ISI reduction techniques are reviewed. A novel technique has been presented which can high-pass shape both static mismatch and ISI error of each element of a multi-bit DAC while decorrelating the instantaneous number of transitions from the input signal. The proposed technique can easily be extended to higher order shaping for both static mismatch and ISI errors. Simulation results show that the proposed technique can improve DAC linearity significantly in presence of both static mismatch and ISI error.

AB - This paper presents techniques to address static and dynamic errors in high performance continuous-time (CT), ΔΣ modulators. The inter-symbol interference (ISI) model is presented and existing ISI reduction techniques are reviewed. A novel technique has been presented which can high-pass shape both static mismatch and ISI error of each element of a multi-bit DAC while decorrelating the instantaneous number of transitions from the input signal. The proposed technique can easily be extended to higher order shaping for both static mismatch and ISI errors. Simulation results show that the proposed technique can improve DAC linearity significantly in presence of both static mismatch and ISI error.

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KW - device mismatch

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KW - dynamic element matching

KW - dynamic error

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KW - thermometer coding

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Dynamic Element Matching Techniques for Static and Dynamic Errors in Continuous-Time Multi-Bit ΔΣ Modulators

Abstract

Keywords

ASJC Scopus subject areas

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