Dynamic analysis of multi-Threaded embedded software to expose atomicity violations

Jay Patel; Yann-Hang Lee

doi:10.1109/ICESS.2016.30

Dynamic analysis of multi-Threaded embedded software to expose atomicity violations

Jay Patel, Yann-Hang Lee

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

Concurrency bugs are one of the most notorious software bugs and may not be observed easily. Significant work has been done on detection of atomicity violations bugs for high performance systems but there is not much work related to detect these bugs for embedded systems. Although criteria to claim existence of bugs remains same, approach changes a bit for embedded systems. The main focus of this research is to develop a systemic methodology to address the issue from embedded systems perspective. A framework is developed which predicts the access interleaving patterns that may violate atomicity using memory references of shared variables and provides support to force and analyze these patterns for any output change, system fault, or change in execution path.

Original language	English (US)
Title of host publication	Proceedings - 2016 13th International Conference on Embedded Software and System, ICESS 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	36-41
Number of pages	6
ISBN (Electronic)	9781509037261
DOIs	https://doi.org/10.1109/ICESS.2016.30
State	Published - Oct 18 2017
Externally published	Yes
Event	13th International Conference on Embedded Software and System, ICESS 2016 - Chengdu, Sichuan, China Duration: Aug 13 2016 → Aug 14 2016

Other

Other	13th International Conference on Embedded Software and System, ICESS 2016
Country	China
City	Chengdu, Sichuan
Period	8/13/16 → 8/14/16

Keywords

Atomicity violation
Concurrency bug
Dynamic analysis
Embedded software
Execution replay
Multi-Threading

ASJC Scopus subject areas

Computer Science Applications
Software
Instrumentation

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Dynamic analysis of multi-Threaded embedded software to expose atomicity violations. / Patel, Jay; Lee, Yann-Hang.

Proceedings - 2016 13th International Conference on Embedded Software and System, ICESS 2016. Institute of Electrical and Electronics Engineers Inc., 2017. p. 36-41 8074438.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Patel, J & Lee, Y-H 2017, Dynamic analysis of multi-Threaded embedded software to expose atomicity violations. in Proceedings - 2016 13th International Conference on Embedded Software and System, ICESS 2016., 8074438, Institute of Electrical and Electronics Engineers Inc., pp. 36-41, 13th International Conference on Embedded Software and System, ICESS 2016, Chengdu, Sichuan, China, 8/13/16. https://doi.org/10.1109/ICESS.2016.30

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