Dynamic analysis of multi-Threaded embedded software to expose atomicity violations

Jay Patel, Yann-Hang Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Concurrency bugs are one of the most notorious software bugs and may not be observed easily. Significant work has been done on detection of atomicity violations bugs for high performance systems but there is not much work related to detect these bugs for embedded systems. Although criteria to claim existence of bugs remains same, approach changes a bit for embedded systems. The main focus of this research is to develop a systemic methodology to address the issue from embedded systems perspective. A framework is developed which predicts the access interleaving patterns that may violate atomicity using memory references of shared variables and provides support to force and analyze these patterns for any output change, system fault, or change in execution path.

Original languageEnglish (US)
Title of host publicationProceedings - 2016 13th International Conference on Embedded Software and System, ICESS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages36-41
Number of pages6
ISBN (Electronic)9781509037261
DOIs
StatePublished - Oct 18 2017
Externally publishedYes
Event13th International Conference on Embedded Software and System, ICESS 2016 - Chengdu, Sichuan, China
Duration: Aug 13 2016Aug 14 2016

Other

Other13th International Conference on Embedded Software and System, ICESS 2016
CountryChina
CityChengdu, Sichuan
Period8/13/168/14/16

    Fingerprint

Keywords

  • Atomicity violation
  • Concurrency bug
  • Dynamic analysis
  • Embedded software
  • Execution replay
  • Multi-Threading

ASJC Scopus subject areas

  • Computer Science Applications
  • Software
  • Instrumentation

Cite this

Patel, J., & Lee, Y-H. (2017). Dynamic analysis of multi-Threaded embedded software to expose atomicity violations. In Proceedings - 2016 13th International Conference on Embedded Software and System, ICESS 2016 (pp. 36-41). [8074438] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICESS.2016.30