Durability evaluation of PV modules using image processing tools

Jiawei Wu, Eric Chan, Raginee Yadav, Hamsini Gopalakrishna, Govindasamy Tamizhmani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the development of three image processing tools to analyze defects and predict performance of the photovoltaic modules using infrared thermography, electroluminescence and ultraviolet induced fluorescent images of the modules. The MATLAB processing tool uses an algorithm aimed at detecting defects and quantifying them in terms of area affected and intensity of the defect. Each image was studied for visual defects, processed and the results from the three techniques were compared. The algorithms lead to detection of defect location with high accuracy. The size and intensity of the defect was computed based on pixel information that was correlated with performance parameters like short circuit current, fill factor, and series resistance depending on the image processing technique used. The infrared image processing technique aided in hotspot detection and removing outliers with elevated cell temperatures for a correlative study with electroluminescence imaging. Electroluminescence image processing demonstrated linear correlation between the inactive cell area and performance parameters like fill factor and series resistance. Ultraviolet induced fluorescence image processing resulted in precise segmentation of browned area and showed a linear correlation with the short-circuit current drop. Ultraviolet induced fluorescence images indicated at the presence of cracks in cells with non-uniform browning based on the corresponding electroluminescence images. The modules in the study were from three different manufacturers to show that the processing tool can work for the different modules.

Original languageEnglish (US)
Title of host publicationNew Concepts in Solar and Thermal Radiation Conversion and Reliability
EditorsJeremy N. Munday, Michael D. Kempe, Peter Bermel
PublisherSPIE
Volume10759
ISBN (Electronic)9781510620896
DOIs
StatePublished - Jan 1 2018
EventNew Concepts in Solar and Thermal Radiation Conversion and Reliability 2018 - San Diego, United States
Duration: Aug 19 2018Aug 21 2018

Other

OtherNew Concepts in Solar and Thermal Radiation Conversion and Reliability 2018
CountryUnited States
CitySan Diego
Period8/19/188/21/18

Fingerprint

Durability
durability
image processing
Electroluminescence
Image Processing
Image processing
Defects
modules
electroluminescence
Module
evaluation
defects
Evaluation
Ultraviolet
short circuit currents
Short circuit currents
Fluorescence
Cell
cells
Infrared Thermography

Keywords

  • Cracks
  • Electroluminescence
  • Encapsulant browning
  • Hotspots
  • Image processing
  • Infrared thermography
  • Photovoltaic module performance correlation
  • Ultraviolet induced fluorescence images

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Wu, J., Chan, E., Yadav, R., Gopalakrishna, H., & Tamizhmani, G. (2018). Durability evaluation of PV modules using image processing tools. In J. N. Munday, M. D. Kempe, & P. Bermel (Eds.), New Concepts in Solar and Thermal Radiation Conversion and Reliability (Vol. 10759). [1075915] SPIE. https://doi.org/10.1117/12.2322500

Durability evaluation of PV modules using image processing tools. / Wu, Jiawei; Chan, Eric; Yadav, Raginee; Gopalakrishna, Hamsini; Tamizhmani, Govindasamy.

New Concepts in Solar and Thermal Radiation Conversion and Reliability. ed. / Jeremy N. Munday; Michael D. Kempe; Peter Bermel. Vol. 10759 SPIE, 2018. 1075915.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Wu, J, Chan, E, Yadav, R, Gopalakrishna, H & Tamizhmani, G 2018, Durability evaluation of PV modules using image processing tools. in JN Munday, MD Kempe & P Bermel (eds), New Concepts in Solar and Thermal Radiation Conversion and Reliability. vol. 10759, 1075915, SPIE, New Concepts in Solar and Thermal Radiation Conversion and Reliability 2018, San Diego, United States, 8/19/18. https://doi.org/10.1117/12.2322500
Wu J, Chan E, Yadav R, Gopalakrishna H, Tamizhmani G. Durability evaluation of PV modules using image processing tools. In Munday JN, Kempe MD, Bermel P, editors, New Concepts in Solar and Thermal Radiation Conversion and Reliability. Vol. 10759. SPIE. 2018. 1075915 https://doi.org/10.1117/12.2322500
Wu, Jiawei ; Chan, Eric ; Yadav, Raginee ; Gopalakrishna, Hamsini ; Tamizhmani, Govindasamy. / Durability evaluation of PV modules using image processing tools. New Concepts in Solar and Thermal Radiation Conversion and Reliability. editor / Jeremy N. Munday ; Michael D. Kempe ; Peter Bermel. Vol. 10759 SPIE, 2018.
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