Double-focusing mixing jet for XFEL study of chemical kinetics

Dingjie Wang, Uwe Weierstall, Lois Pollack, John Spence

Research output: Contribution to journalArticle

41 Citations (Scopus)

Abstract

Several liquid sample injection methods have been developed to satisfy the requirements for serial femtosecond X-ray nanocrystallography, which enables radiation-damage-free determination of molecular structure at room temperature. Time-resolved nanocrystallography would combine structure analysis with chemical kinetics by determining the structures of the transient states and chemical kinetic mechanisms simultaneously. A windowless liquid mixing jet device has been designed for this purpose. It achieves fast uniform mixing of substrates and enzymes in the jet within 250 µs, with an adjustable delay between mixing and probing by the X-ray free-electron laser beam of up to 1 s for each frame of a `movie'. The principle of the liquid mixing jet device is illustrated using numerical simulation, and experimental results are presented using a fluorescent dye.

Original languageEnglish (US)
Pages (from-to)1364-1366
Number of pages3
JournalJournal of Synchrotron Radiation
Volume21
DOIs
StatePublished - Nov 1 2014

Fingerprint

Reaction kinetics
reaction kinetics
X-Rays
Equipment and Supplies
Motion Pictures
Molecular Structure
Fluorescent Dyes
Liquids
Lasers
liquids
Electrons
Radiation
X ray lasers
Injections
Temperature
Free electron lasers
Radiation damage
Enzymes
radiation damage
free electron lasers

Keywords

  • chemical kinetics
  • mixing jet
  • sample injection
  • time-resolved diffraction

ASJC Scopus subject areas

  • Medicine(all)

Cite this

Double-focusing mixing jet for XFEL study of chemical kinetics. / Wang, Dingjie; Weierstall, Uwe; Pollack, Lois; Spence, John.

In: Journal of Synchrotron Radiation, Vol. 21, 01.11.2014, p. 1364-1366.

Research output: Contribution to journalArticle

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