TY - GEN
T1 - Disturbance-free BIST for loop characterization of DC-DC buck converters
AU - Beohar, Navankur
AU - Bakliwal, Priyanka
AU - Roy, Sidhanto
AU - Mandal, Debashis
AU - Adell, Philippe
AU - Vermeire, Bert
AU - Bakkaloglu, Bertan
AU - Ozev, Sule
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/6/1
Y1 - 2015/6/1
N2 - Complex electronic systems include multiple power domains and drastically varying dynamic power consumption patterns, requiring the use of multiple power conversion and regulation units. High frequency switching converters have been gaining prominence in the DC-DC converter market due to their high efficiency. Unfortunately, they are also subject to higher process variations jeopardizing stable operation of the power supply. This paper presents a technique to track changes in the dynamic loop characteristics of the DC-DC converters without disturbing the normal mode of operation using a white noise based excitation and correlation. White noise excitation is generated via pseudo random disturbance at reference and PWM input of the converter with the test signal energy being spread over a wide bandwidth, below the converter noise and ripple floor. Test signal analysis is achieved by correlating the pseudo random input sequence with the output response and thereby accumulating the desired behavior over time and pulling it above the noise floor of the measurement set-up. An off-the-shelf power converter, LM27402 is used as the DUT for the experimental verification. Experimental results show that the proposed technique can estimate converter's natural frequency and Q-factor within ±2.5% and ±0.7% error margin respectively, over changes in load inductance and capacitance.
AB - Complex electronic systems include multiple power domains and drastically varying dynamic power consumption patterns, requiring the use of multiple power conversion and regulation units. High frequency switching converters have been gaining prominence in the DC-DC converter market due to their high efficiency. Unfortunately, they are also subject to higher process variations jeopardizing stable operation of the power supply. This paper presents a technique to track changes in the dynamic loop characteristics of the DC-DC converters without disturbing the normal mode of operation using a white noise based excitation and correlation. White noise excitation is generated via pseudo random disturbance at reference and PWM input of the converter with the test signal energy being spread over a wide bandwidth, below the converter noise and ripple floor. Test signal analysis is achieved by correlating the pseudo random input sequence with the output response and thereby accumulating the desired behavior over time and pulling it above the noise floor of the measurement set-up. An off-the-shelf power converter, LM27402 is used as the DUT for the experimental verification. Experimental results show that the proposed technique can estimate converter's natural frequency and Q-factor within ±2.5% and ±0.7% error margin respectively, over changes in load inductance and capacitance.
UR - http://www.scopus.com/inward/record.url?scp=84940421810&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84940421810&partnerID=8YFLogxK
U2 - 10.1109/VTS.2015.7116250
DO - 10.1109/VTS.2015.7116250
M3 - Conference contribution
AN - SCOPUS:84940421810
T3 - Proceedings of the IEEE VLSI Test Symposium
BT - Proceedings - 2015 IEEE 33rd VLSI Test Symposium, VTS 2015
PB - IEEE Computer Society
T2 - 2015 33rd IEEE VLSI Test Symposium, VTS 2015
Y2 - 27 April 2015 through 29 April 2015
ER -