Dissociated 60° dislocations in cdte studied by high-resolution electron microscopy

Ping Lu, David Smith

Research output: Contribution to journalArticlepeer-review

15 Scopus citations


High-resolution electron microscopy has been used to characterize disclo-cations in CdTe which were induced by argon ion-beam milling. The core structures of the 30° and 90° partial dislocations resulting from the dissociation of 60° dislocations have been analysed with assistance from multislice image simulations, and it is found that various structural models (glide set and shuffle set) can be differentiated. Chemical information (tx or P form) about the dislocations can be deduced by first determining the Burgers vectors of the dislocations and the crystal polarity. Experimentally, for a 60° dislocation dissociated with an intrinsic stacking fault, the 30° partial is found to be the glide set, independent of its chemical nature; however, no shuffle set is found. For a 60° dislocation dissociated with an extrinsic stacking fault, the 90° partial is usually kinked and therefore much more difficult to recognize. In one particular example, however, it was found to be the glide set.

Original languageEnglish (US)
Pages (from-to)435-450
Number of pages16
JournalPhilosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
Issue number4
StatePublished - Oct 1990

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Physics and Astronomy(all)

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