Discussion on statistically-based process monitoring and control

Control charts and other related techniques for statistical process monitoring are in widespread use. The last 20 years have seen increasing emphasis on statistical process control as a practical approach to reducing variability in industrial applications. Simultaneously, there has been renewed interest in the subject by the academic and research communities. This has resulted in many new techniques and procedures, as well as better understanding of the performance and the limitations of well-established ones. This panel discussion is a technical discussion of control charts and other related methods for process monitoring. The panel consists of a group of researchers and practitioners who are involved in the development, evaluation, and application of these techniques. Topics considered by the panel include multivariate quality control, autocorrelated data, enhancements to the basic Shewhart control charts, economic design and related issues, and the relationship of statistical process monitoring and direct process adjustment through engineering control. The panel considers practical aspects of the application of these techniques as well as future trends in research and development.