Direct phasing in femtosecond nanocrystallography. II. Phase retrieval

Joe P J Chen, John Spence, Rick P. Millane

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

X-ray free-electron laser diffraction patterns from protein nanocrystals provide information on the diffracted amplitudes between the Bragg reflections, offering the possibility of direct phase retrieval without the use of ancillary experimental diffraction data [Spence et al. (2011). Opt. Express, 19, 2866-2873]. The estimated continuous transform is highly noisy however [Chen et al. (2014). Acta Cryst. A70, 143-153]. This second of a series of two papers describes a data-selection strategy to ameliorate the effects of the high noise levels and the subsequent use of iterative phase-retrieval algorithms to reconstruct the electron density. Simulation results show that employing such a strategy increases the noise levels that can be tolerated.

Original languageEnglish (US)
Pages (from-to)154-161
Number of pages8
JournalActa Crystallographica Section A: Foundations and Advances
Volume70
Issue number2
DOIs
StatePublished - 2014

Fingerprint

X ray lasers
Free electron lasers
Nanocrystals
Diffraction patterns
retrieval
Carrier concentration
Noise
Diffraction
Electrons
Proteins
free electron lasers
Nanoparticles
nanocrystals
Lasers
diffraction patterns
X-Rays
proteins
diffraction
x rays
simulation

Keywords

  • Direct phasing
  • Femtosecond crystallography
  • Iterative transform algorithms
  • Nanocrystals
  • Shape transform
  • X-ray free-electron lasers

ASJC Scopus subject areas

  • Structural Biology
  • Biochemistry
  • Inorganic Chemistry
  • Physical and Theoretical Chemistry
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Direct phasing in femtosecond nanocrystallography. II. Phase retrieval. / Chen, Joe P J; Spence, John; Millane, Rick P.

In: Acta Crystallographica Section A: Foundations and Advances, Vol. 70, No. 2, 2014, p. 154-161.

Research output: Contribution to journalArticle

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