Direct observations of metal support interaction in nano-scale systems

R. F. Klie, K. Sun, M. M. Disko, Jingyue Liu, N. D. Browning

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we will describe the experimental processes involved in analytical atomic-resolution scanning transmission electron microscopy (STEM) of supported nano-scale systems. We show that the combination of high-resolution Z-contrast imaging and electron energy loss spectroscopy (EELS) provides an analytical tool with unprecedented chemical and spatial sensitivity that is vital for studying interfaces in heterogeneous catalyst systems. We apply the described methods to study two example heterogeneous catalyst systems: Pt/SiO 2, and Cu/Al 2O 3. In particular, the presence of a few monolayers of platinum oxide in Pt/SiO 2 can be clearly seen, and changes in the chemistry of the SiO 2 support within ≈1 nm of the metal-oxide interface can be characterized as a function of the catalyst preparation conditions. The Cu/Al 2O 3, reduced at various temperatures, exhibits an increasing oxidation of the Cu-particles upon higher temperature reduction.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsJ.Z. Zhang, Z.L. Wang
Pages59-70
Number of pages12
Volume4807
DOIs
StatePublished - 2002
Externally publishedYes
EventPhysical Chemistry of Interfaces and Nanomaterials - Seattle, WA, United States
Duration: Jul 7 2002Jul 9 2002

Other

OtherPhysical Chemistry of Interfaces and Nanomaterials
CountryUnited States
CitySeattle, WA
Period7/7/027/9/02

Keywords

  • Cu/Al O
  • EELS
  • Heterogeneous catalyst
  • Pt/SiO
  • STEM
  • Z-contrast imaging

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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  • Cite this

    Klie, R. F., Sun, K., Disko, M. M., Liu, J., & Browning, N. D. (2002). Direct observations of metal support interaction in nano-scale systems. In J. Z. Zhang, & Z. L. Wang (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4807, pp. 59-70) https://doi.org/10.1117/12.450936