Abstract
There have been growing interests in selective control of thermal emission by using micro/nanostructures. The present study describes direct measurements of infrared thermal emission at elevated temperatures of an asymmetric Fabry-Perot resonator at variable angles for each polarization. The multilayered structure mainly contains a SiO 2 optical cavity sandwiched between a thick (opaque) Au film and a thin Au film. Metallic adhesive and diffusion-barrier layers were deposited on a Si substrate before depositing the thick Au film. A dielectric protection layer was deposited atop the thin Au film to prevent oxidation at high temperatures. A SiC wafer was used as the reference to test the emittance measurement facility, which includes a heated sample holder, a blackbody source, mirror assembly, a polarizer, and a Fourier-transform infrared spectrometer with different detectors. The measured emittance spectra of the Fabry-Perot structure exhibit peak broadening and shifting as temperature increases; the mechanisms are elucidated by comparison with theoretical modeling.
Original language | English (US) |
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Article number | 072701 |
Journal | Journal of Heat Transfer |
Volume | 134 |
Issue number | 7 |
DOIs | |
State | Published - Jun 29 2012 |
Externally published | Yes |
Keywords
- high temperature
- thermal emission
- thin films
- wave interferences
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering