Direct measurement of thermal emission from a Fabry-Perot cavity resonator

L. P. Wang, S. Basu, Z. M. Zhang

Research output: Contribution to journalArticle

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Abstract

There have been growing interests in selective control of thermal emission by using micro/nanostructures. The present study describes direct measurements of infrared thermal emission at elevated temperatures of an asymmetric Fabry-Perot resonator at variable angles for each polarization. The multilayered structure mainly contains a SiO 2 optical cavity sandwiched between a thick (opaque) Au film and a thin Au film. Metallic adhesive and diffusion-barrier layers were deposited on a Si substrate before depositing the thick Au film. A dielectric protection layer was deposited atop the thin Au film to prevent oxidation at high temperatures. A SiC wafer was used as the reference to test the emittance measurement facility, which includes a heated sample holder, a blackbody source, mirror assembly, a polarizer, and a Fourier-transform infrared spectrometer with different detectors. The measured emittance spectra of the Fabry-Perot structure exhibit peak broadening and shifting as temperature increases; the mechanisms are elucidated by comparison with theoretical modeling.

Original languageEnglish (US)
Article number072701
JournalJournal of Heat Transfer
Volume134
Issue number7
DOIs
StatePublished - Jun 29 2012
Externally publishedYes

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Keywords

  • high temperature
  • thermal emission
  • thin films
  • wave interferences

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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