TY - GEN
T1 - Digital image restoration by exposure-splitting and registration
AU - Wei, Zile
AU - Cao, Yu
AU - Newton, A. Richard
PY - 2004
Y1 - 2004
N2 - With the explosion of digital imaging systems, high image noise levels, particularly motion blur and sensor noise, limit applications of mobile cameras. In this paper, a novel restoration approach is developed. By uniformly splitting the exposure time and averaging the multiple under-exposed captures, a single image is obtained, in which both types of noise are mitigated. Comprehensive experiments demonstrate successful image restoration under various exposure conditions. Exposure-splitting is further optimized to fully recover the image quality under severe motion blur. This technique can be easily implemented into contemporary digital imaging systems.
AB - With the explosion of digital imaging systems, high image noise levels, particularly motion blur and sensor noise, limit applications of mobile cameras. In this paper, a novel restoration approach is developed. By uniformly splitting the exposure time and averaging the multiple under-exposed captures, a single image is obtained, in which both types of noise are mitigated. Comprehensive experiments demonstrate successful image restoration under various exposure conditions. Exposure-splitting is further optimized to fully recover the image quality under severe motion blur. This technique can be easily implemented into contemporary digital imaging systems.
UR - http://www.scopus.com/inward/record.url?scp=10044248102&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=10044248102&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2004.1333858
DO - 10.1109/ICPR.2004.1333858
M3 - Conference contribution
AN - SCOPUS:10044248102
SN - 0769521282
T3 - Proceedings - International Conference on Pattern Recognition
SP - 657
EP - 660
BT - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
A2 - Kittler, J.
A2 - Petrou, M.
A2 - Nixon, M.
T2 - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
Y2 - 23 August 2004 through 26 August 2004
ER -