Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators

Mehmet Ince, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

With the increasing complexity of electronic components in critical applications, pressure on single components to have zero defects is also increasing. Thus there is a need to explore built-in self-test and other non-traditional test techniques for mixed-signal circuits, such as data converters, phase locked loops and power converters. In this paper, we present an extremely low cost, digital built-in self-test methodology for Low Dropout Regulators (LDO), specifically used for defect detection. The technique relies on perturbing the LDO loop at the reference voltage input via pseudo random binary sequence which has white noise characteristics and cross correlating the output of LDO with input excitation using only digital circuits, thus inducing low power and area overhead. The built-in self-test technique together with an LDO is designed using 65nm TMSC technology. Transistor level structural fault simulations display that all inserted faults can be detected even if they do not change the DC level of the LDO output.

Original languageEnglish (US)
Title of host publicationProceedings - 2020 IEEE European Test Symposium, ETS 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728143125
DOIs
StatePublished - May 2020
Event2020 IEEE European Test Symposium, ETS 2020 - Tallinn, Estonia
Duration: May 25 2020May 29 2020

Publication series

NameProceedings of the European Test Workshop
Volume2020-May
ISSN (Print)1530-1877
ISSN (Electronic)1558-1780

Conference

Conference2020 IEEE European Test Symposium, ETS 2020
CountryEstonia
CityTallinn
Period5/25/205/29/20

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Software

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