Diffusion characterization using electron beam induced current and time-resolved photoluminescence of InAs/InAsSb type-II superlattices

D. Zuo, R. Liu, J. Mabon, Z. Y. He, S. Liu, Yong-Hang Zhang, E. A. Kadlec, B. Olson, E. A. Shaner, D. Wasserman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present the characterization of minority carrier diffusion length and surface recombination velocity, as well as vertical diffusivity and mobility by performing an electron beam induced current measurement in addition to an optical lifetime measurement.

Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics Europe - Technical Digest
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2015-August
ISBN (Print)9781557529688
StatePublished - Aug 10 2015
EventConference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States
Duration: May 10 2015May 15 2015

Other

OtherConference on Lasers and Electro-Optics, CLEO 2015
CountryUnited States
CitySan Jose
Period5/10/155/15/15

Fingerprint

Induced currents
Superlattices
superlattices
Electron beams
Photoluminescence
electron beams
photoluminescence
Electric current measurement
diffusion length
minority carriers
diffusivity
life (durability)
indium arsenide

Keywords

  • Current measurement
  • Electron beams
  • Optical variables measurement
  • Performance evaluation
  • Photoluminescence
  • Spontaneous emission
  • Superlattices

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials

Cite this

Zuo, D., Liu, R., Mabon, J., He, Z. Y., Liu, S., Zhang, Y-H., ... Wasserman, D. (2015). Diffusion characterization using electron beam induced current and time-resolved photoluminescence of InAs/InAsSb type-II superlattices. In Conference on Lasers and Electro-Optics Europe - Technical Digest (Vol. 2015-August). [7183848] Institute of Electrical and Electronics Engineers Inc..

Diffusion characterization using electron beam induced current and time-resolved photoluminescence of InAs/InAsSb type-II superlattices. / Zuo, D.; Liu, R.; Mabon, J.; He, Z. Y.; Liu, S.; Zhang, Yong-Hang; Kadlec, E. A.; Olson, B.; Shaner, E. A.; Wasserman, D.

Conference on Lasers and Electro-Optics Europe - Technical Digest. Vol. 2015-August Institute of Electrical and Electronics Engineers Inc., 2015. 7183848.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zuo, D, Liu, R, Mabon, J, He, ZY, Liu, S, Zhang, Y-H, Kadlec, EA, Olson, B, Shaner, EA & Wasserman, D 2015, Diffusion characterization using electron beam induced current and time-resolved photoluminescence of InAs/InAsSb type-II superlattices. in Conference on Lasers and Electro-Optics Europe - Technical Digest. vol. 2015-August, 7183848, Institute of Electrical and Electronics Engineers Inc., Conference on Lasers and Electro-Optics, CLEO 2015, San Jose, United States, 5/10/15.
Zuo D, Liu R, Mabon J, He ZY, Liu S, Zhang Y-H et al. Diffusion characterization using electron beam induced current and time-resolved photoluminescence of InAs/InAsSb type-II superlattices. In Conference on Lasers and Electro-Optics Europe - Technical Digest. Vol. 2015-August. Institute of Electrical and Electronics Engineers Inc. 2015. 7183848
Zuo, D. ; Liu, R. ; Mabon, J. ; He, Z. Y. ; Liu, S. ; Zhang, Yong-Hang ; Kadlec, E. A. ; Olson, B. ; Shaner, E. A. ; Wasserman, D. / Diffusion characterization using electron beam induced current and time-resolved photoluminescence of InAs/InAsSb type-II superlattices. Conference on Lasers and Electro-Optics Europe - Technical Digest. Vol. 2015-August Institute of Electrical and Electronics Engineers Inc., 2015.
@inproceedings{2850cdd6e66241bf992c6d352fb42954,
title = "Diffusion characterization using electron beam induced current and time-resolved photoluminescence of InAs/InAsSb type-II superlattices",
abstract = "We present the characterization of minority carrier diffusion length and surface recombination velocity, as well as vertical diffusivity and mobility by performing an electron beam induced current measurement in addition to an optical lifetime measurement.",
keywords = "Current measurement, Electron beams, Optical variables measurement, Performance evaluation, Photoluminescence, Spontaneous emission, Superlattices",
author = "D. Zuo and R. Liu and J. Mabon and He, {Z. Y.} and S. Liu and Yong-Hang Zhang and Kadlec, {E. A.} and B. Olson and Shaner, {E. A.} and D. Wasserman",
year = "2015",
month = "8",
day = "10",
language = "English (US)",
isbn = "9781557529688",
volume = "2015-August",
booktitle = "Conference on Lasers and Electro-Optics Europe - Technical Digest",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - GEN

T1 - Diffusion characterization using electron beam induced current and time-resolved photoluminescence of InAs/InAsSb type-II superlattices

AU - Zuo, D.

AU - Liu, R.

AU - Mabon, J.

AU - He, Z. Y.

AU - Liu, S.

AU - Zhang, Yong-Hang

AU - Kadlec, E. A.

AU - Olson, B.

AU - Shaner, E. A.

AU - Wasserman, D.

PY - 2015/8/10

Y1 - 2015/8/10

N2 - We present the characterization of minority carrier diffusion length and surface recombination velocity, as well as vertical diffusivity and mobility by performing an electron beam induced current measurement in addition to an optical lifetime measurement.

AB - We present the characterization of minority carrier diffusion length and surface recombination velocity, as well as vertical diffusivity and mobility by performing an electron beam induced current measurement in addition to an optical lifetime measurement.

KW - Current measurement

KW - Electron beams

KW - Optical variables measurement

KW - Performance evaluation

KW - Photoluminescence

KW - Spontaneous emission

KW - Superlattices

UR - http://www.scopus.com/inward/record.url?scp=84954064965&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84954064965&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9781557529688

VL - 2015-August

BT - Conference on Lasers and Electro-Optics Europe - Technical Digest

PB - Institute of Electrical and Electronics Engineers Inc.

ER -