@inproceedings{2850cdd6e66241bf992c6d352fb42954,
title = "Diffusion characterization using electron beam induced current and time-resolved photoluminescence of InAs/InAsSb type-II superlattices",
abstract = "We present the characterization of minority carrier diffusion length and surface recombination velocity, as well as vertical diffusivity and mobility by performing an electron beam induced current measurement in addition to an optical lifetime measurement.",
keywords = "Current measurement, Electron beams, Optical variables measurement, Performance evaluation, Photoluminescence, Spontaneous emission, Superlattices",
author = "D. Zuo and R. Liu and J. Mabon and He, {Z. Y.} and S. Liu and Yong-Hang Zhang and Kadlec, {E. A.} and B. Olson and Shaner, {E. A.} and D. Wasserman",
note = "Publisher Copyright: {\textcopyright} 2015 OSA.; Conference on Lasers and Electro-Optics, CLEO 2015 ; Conference date: 10-05-2015 Through 15-05-2015",
year = "2015",
month = aug,
day = "10",
language = "English (US)",
series = "Conference on Lasers and Electro-Optics Europe - Technical Digest",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2015 Conference on Lasers and Electro-Optics, CLEO 2015",
}