Abstract
We present the characterization of minority carrier diffusion length and surface recombination velocity, as well as vertical diffusivity and mobility by performing an electron beam induced current measurement in addition to an optical lifetime measurement.
Original language | English (US) |
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Title of host publication | CLEO: Science and Innovations, CLEO-SI 2015 |
Publisher | Optical Society of America (OSA) |
Pages | 2267 |
Number of pages | 1 |
ISBN (Print) | 9781557529688 |
DOIs | |
State | Published - May 4 2015 |
Event | CLEO: Science and Innovations, CLEO-SI 2015 - San Jose, United States Duration: May 10 2015 → May 15 2015 |
Other
Other | CLEO: Science and Innovations, CLEO-SI 2015 |
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Country/Territory | United States |
City | San Jose |
Period | 5/10/15 → 5/15/15 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics