Diffraction patterns of artificial two-dimensional crystals synthesized in situ in an environmental scanning transmission electron microscope

W. F. Van Dorp, B. Van Someren, C. W. Hagen, P. Kruit, Peter Crozier

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

In this study, we demonstrated the use of electron-beam-induced deposition for synthesis of artificial two-dimensional crystals with an in situ scanning transmission electron microscope. The structures were deposited from W(CO) 6 in an environmental scanning transmission electron microscope on a 30-nm-thick Si3N4 substrate. We present clear electron beam diffraction patterns taken from those structures. The distance between the diffraction peaks corresponded to the dot spacing in the self-made surface crystal. We propose using these arrays of dots as anchor points for making artificial crystals for diffraction analysis of weakly scattering or beam-sensitive molecules such as proteins.

Original languageEnglish (US)
Pages (from-to)159-163
Number of pages5
JournalJournal of Microscopy
Volume221
Issue number3
DOIs
StatePublished - Mar 1 2006

Keywords

  • Artificial crystal
  • Diffraction
  • Electron-beam-induced deposition
  • Environmental
  • High resolution
  • Scanning transmission electron microscope
  • Two-dimensional

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology

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