Abstract
In this study, we demonstrated the use of electron-beam-induced deposition for synthesis of artificial two-dimensional crystals with an in situ scanning transmission electron microscope. The structures were deposited from W(CO) 6 in an environmental scanning transmission electron microscope on a 30-nm-thick Si3N4 substrate. We present clear electron beam diffraction patterns taken from those structures. The distance between the diffraction peaks corresponded to the dot spacing in the self-made surface crystal. We propose using these arrays of dots as anchor points for making artificial crystals for diffraction analysis of weakly scattering or beam-sensitive molecules such as proteins.
Original language | English (US) |
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Pages (from-to) | 159-163 |
Number of pages | 5 |
Journal | Journal of Microscopy |
Volume | 221 |
Issue number | 3 |
DOIs | |
State | Published - Mar 1 2006 |
Keywords
- Artificial crystal
- Diffraction
- Electron-beam-induced deposition
- Environmental
- High resolution
- Scanning transmission electron microscope
- Two-dimensional
ASJC Scopus subject areas
- Pathology and Forensic Medicine
- Histology