The amorphous structures of silica, silicon, and germanium were studied. Using transmission electron microscopy, the diffraction intensity and associated fluctuations in both reciprocal and real spaces were obtained. An orientational variance in diffuse reflections was also computed in order to observe the medium range order of the structures. Using fluctuation microscopy, it was found that amorphous germanium showed a slightly disordered structure compared to amorphous silicon.
ASJC Scopus subject areas
- Physics and Astronomy(all)