Differential phase contrast in TEM

Martha McCartney; P. Kruit; A. H. Buist; M. R. Scheinfein

doi:10.1016/S0304-3991(96)00068-X

Differential phase contrast in TEM

Martha McCartney, P. Kruit, A. H. Buist, M. R. Scheinfein

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

We present the first results using a novel transmission electron microscope (TEM) technique that combines electron holography and Fresnel imaging to give simultaneous information about magnetization and domain wall position in magnetic materials. This technique provides differential phase contrast through electron holography in a manner similar to the established differential mode in scanning transmission electron microscopy. It has been implemented by placement of an electrostatic biprism in the condenser aperture plane of a field emission TEM. Changes of one in-plane component of the magnetic field of a Co specimen have been imaged. With rotation of either the biprism or the specimen, it should be possible to map the entire in-plane magnetic field.

Original language	English (US)
Pages (from-to)	179-186
Number of pages	8
Journal	Ultramicroscopy
Volume	65
Issue number	3-4
DOIs	https://doi.org/10.1016/S0304-3991(96)00068-X
State	Published - Oct 1996

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

Access to Document

10.1016/S0304-3991(96)00068-X

Cite this

@article{f7ca53687d4c498db5123705105e0b0a,

title = "Differential phase contrast in TEM",

abstract = "We present the first results using a novel transmission electron microscope (TEM) technique that combines electron holography and Fresnel imaging to give simultaneous information about magnetization and domain wall position in magnetic materials. This technique provides differential phase contrast through electron holography in a manner similar to the established differential mode in scanning transmission electron microscopy. It has been implemented by placement of an electrostatic biprism in the condenser aperture plane of a field emission TEM. Changes of one in-plane component of the magnetic field of a Co specimen have been imaged. With rotation of either the biprism or the specimen, it should be possible to map the entire in-plane magnetic field.",

author = "Martha McCartney and P. Kruit and Buist, {A. H.} and Scheinfein, {M. R.}",

year = "1996",

month = oct,

doi = "10.1016/S0304-3991(96)00068-X",

language = "English (US)",

volume = "65",

pages = "179--186",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "3-4",

}

TY - JOUR

T1 - Differential phase contrast in TEM

AU - McCartney, Martha

AU - Kruit, P.

AU - Buist, A. H.

AU - Scheinfein, M. R.

PY - 1996/10

Y1 - 1996/10

N2 - We present the first results using a novel transmission electron microscope (TEM) technique that combines electron holography and Fresnel imaging to give simultaneous information about magnetization and domain wall position in magnetic materials. This technique provides differential phase contrast through electron holography in a manner similar to the established differential mode in scanning transmission electron microscopy. It has been implemented by placement of an electrostatic biprism in the condenser aperture plane of a field emission TEM. Changes of one in-plane component of the magnetic field of a Co specimen have been imaged. With rotation of either the biprism or the specimen, it should be possible to map the entire in-plane magnetic field.

AB - We present the first results using a novel transmission electron microscope (TEM) technique that combines electron holography and Fresnel imaging to give simultaneous information about magnetization and domain wall position in magnetic materials. This technique provides differential phase contrast through electron holography in a manner similar to the established differential mode in scanning transmission electron microscopy. It has been implemented by placement of an electrostatic biprism in the condenser aperture plane of a field emission TEM. Changes of one in-plane component of the magnetic field of a Co specimen have been imaged. With rotation of either the biprism or the specimen, it should be possible to map the entire in-plane magnetic field.

UR - http://www.scopus.com/inward/record.url?scp=0030272474&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030272474&partnerID=8YFLogxK

U2 - 10.1016/S0304-3991(96)00068-X

DO - 10.1016/S0304-3991(96)00068-X

M3 - Article

AN - SCOPUS:0030272474

SN - 0304-3991

VL - 65

SP - 179

EP - 186

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 3-4

ER -

Differential phase contrast in TEM

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this