Dielectric spectroscopy of thin films by dual channel impedance measurements on differential interdigitated electrode arrays

Z. Chen, A. Sepúlveda, M. D. Ediger, Ranko Richert

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

We report a new approach to measuring the dielectric behavior of thin films by means of differential interdigitated electrode (IDE) cells coupled with a dual-channel impedance measurement setup. The differential IDE cell consists of two identical IDE's on a common substrate. With one IDE loaded with sample and the other one empty, the complex permittivities of both capacitors are measured simultaneously by means of a dual-channel impedance measurement setup. The net dielectric response of the material under study is then obtained by the difference of the two permittivities, which corrects for the substrate contribution. The applicability of this approach is examined with bulk glycerol and a 600 nm indomethacin film and is evidenced by the results being consistent with those measured by conventional methods. The main advantages of this new approach include a simplified preparation technique for thin film samples and a straightforward correction for the substrate contribution by subtracting the empty IDE signal obtained at the same temperature and thermal history.

Original languageEnglish (US)
Article number268
JournalEuropean Physical Journal B
Volume85
Issue number8
DOIs
StatePublished - Aug 2012

Fingerprint

Dielectric spectroscopy
impedance measurement
Thin films
Electrodes
electrodes
thin films
spectroscopy
Permittivity
Substrates
permittivity
glycerols
cells
Glycerol
Indomethacin
capacitors
Capacitors
histories
preparation
Temperature
temperature

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Dielectric spectroscopy of thin films by dual channel impedance measurements on differential interdigitated electrode arrays. / Chen, Z.; Sepúlveda, A.; Ediger, M. D.; Richert, Ranko.

In: European Physical Journal B, Vol. 85, No. 8, 268, 08.2012.

Research output: Contribution to journalArticle

@article{1120a106b6144cc19207c4faf7f675da,
title = "Dielectric spectroscopy of thin films by dual channel impedance measurements on differential interdigitated electrode arrays",
abstract = "We report a new approach to measuring the dielectric behavior of thin films by means of differential interdigitated electrode (IDE) cells coupled with a dual-channel impedance measurement setup. The differential IDE cell consists of two identical IDE's on a common substrate. With one IDE loaded with sample and the other one empty, the complex permittivities of both capacitors are measured simultaneously by means of a dual-channel impedance measurement setup. The net dielectric response of the material under study is then obtained by the difference of the two permittivities, which corrects for the substrate contribution. The applicability of this approach is examined with bulk glycerol and a 600 nm indomethacin film and is evidenced by the results being consistent with those measured by conventional methods. The main advantages of this new approach include a simplified preparation technique for thin film samples and a straightforward correction for the substrate contribution by subtracting the empty IDE signal obtained at the same temperature and thermal history.",
author = "Z. Chen and A. Sep{\'u}lveda and Ediger, {M. D.} and Ranko Richert",
year = "2012",
month = "8",
doi = "10.1140/epjb/e2012-30363-0",
language = "English (US)",
volume = "85",
journal = "Zeitschrift für Physik B Condensed Matter and Quanta",
issn = "0340-224X",
publisher = "Springer New York",
number = "8",

}

TY - JOUR

T1 - Dielectric spectroscopy of thin films by dual channel impedance measurements on differential interdigitated electrode arrays

AU - Chen, Z.

AU - Sepúlveda, A.

AU - Ediger, M. D.

AU - Richert, Ranko

PY - 2012/8

Y1 - 2012/8

N2 - We report a new approach to measuring the dielectric behavior of thin films by means of differential interdigitated electrode (IDE) cells coupled with a dual-channel impedance measurement setup. The differential IDE cell consists of two identical IDE's on a common substrate. With one IDE loaded with sample and the other one empty, the complex permittivities of both capacitors are measured simultaneously by means of a dual-channel impedance measurement setup. The net dielectric response of the material under study is then obtained by the difference of the two permittivities, which corrects for the substrate contribution. The applicability of this approach is examined with bulk glycerol and a 600 nm indomethacin film and is evidenced by the results being consistent with those measured by conventional methods. The main advantages of this new approach include a simplified preparation technique for thin film samples and a straightforward correction for the substrate contribution by subtracting the empty IDE signal obtained at the same temperature and thermal history.

AB - We report a new approach to measuring the dielectric behavior of thin films by means of differential interdigitated electrode (IDE) cells coupled with a dual-channel impedance measurement setup. The differential IDE cell consists of two identical IDE's on a common substrate. With one IDE loaded with sample and the other one empty, the complex permittivities of both capacitors are measured simultaneously by means of a dual-channel impedance measurement setup. The net dielectric response of the material under study is then obtained by the difference of the two permittivities, which corrects for the substrate contribution. The applicability of this approach is examined with bulk glycerol and a 600 nm indomethacin film and is evidenced by the results being consistent with those measured by conventional methods. The main advantages of this new approach include a simplified preparation technique for thin film samples and a straightforward correction for the substrate contribution by subtracting the empty IDE signal obtained at the same temperature and thermal history.

UR - http://www.scopus.com/inward/record.url?scp=84866532612&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84866532612&partnerID=8YFLogxK

U2 - 10.1140/epjb/e2012-30363-0

DO - 10.1140/epjb/e2012-30363-0

M3 - Article

VL - 85

JO - Zeitschrift für Physik B Condensed Matter and Quanta

JF - Zeitschrift für Physik B Condensed Matter and Quanta

SN - 0340-224X

IS - 8

M1 - 268

ER -