Dielectric relaxation under constant charge conditions

Ranko Richert, Hermann Wagner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The common technique of dielectric ε *(co) or ε(t) measurements involves the application of a polarization invariant electric field to a capacitor filled with the material under study and the detection of the temporal evolution of the resulting current or charge flow. The counterpart condition of applying a given dielectric displacement and monitoring the electric field relates to the dielectric modulus M(t) with M *(ω) = 1/ε *(ω). Isothermal and thermally stimulated experimental techniques for directly accessing the relaxation M(t) are outlined and discussed as regards their relation to the dielectric retardation ε(t) and to dc-conductivity σ dc. We also address several microscopic processes which are inherently linked to the dielectric modulus through their common feature of displaying a redistribution of charge.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages49-58
Number of pages10
Volume3181
DOIs
StatePublished - 1997
Externally publishedYes
EventDielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications - Szczyrk, Poland
Duration: Sep 16 1996Sep 16 1996

Other

OtherDielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications
CountryPoland
CitySzczyrk
Period9/16/969/16/96

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Keywords

  • dc-conductivity
  • Dielectric relaxation
  • Thermal stimulation

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Richert, R., & Wagner, H. (1997). Dielectric relaxation under constant charge conditions. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3181, pp. 49-58) https://doi.org/10.1117/12.276276