Abstract
The common technique of dielectric ε *(co) or ε(t) measurements involves the application of a polarization invariant electric field to a capacitor filled with the material under study and the detection of the temporal evolution of the resulting current or charge flow. The counterpart condition of applying a given dielectric displacement and monitoring the electric field relates to the dielectric modulus M(t) with M *(ω) = 1/ε *(ω). Isothermal and thermally stimulated experimental techniques for directly accessing the relaxation M(t) are outlined and discussed as regards their relation to the dielectric retardation ε(t) and to dc-conductivity σ dc. We also address several microscopic processes which are inherently linked to the dielectric modulus through their common feature of displaying a redistribution of charge.
Original language | English (US) |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Pages | 49-58 |
Number of pages | 10 |
Volume | 3181 |
DOIs | |
State | Published - 1997 |
Externally published | Yes |
Event | Dielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications - Szczyrk, Poland Duration: Sep 16 1996 → Sep 16 1996 |
Other
Other | Dielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications |
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Country/Territory | Poland |
City | Szczyrk |
Period | 9/16/96 → 9/16/96 |
Keywords
- dc-conductivity
- Dielectric relaxation
- Thermal stimulation
ASJC Scopus subject areas
- Applied Mathematics
- Computer Science Applications
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics