Dielectric hole burning

Signature of dielectric and thermal relaxation time heterogeneity

Kenneth R. Jeffrey, Ranko Richert, Kalyan Duvvuri

Research output: Contribution to journalArticle

48 Citations (Scopus)

Abstract

The effects of dielectric hole burning on the basis of the frequency dependent dielectric relaxation and specific heat of glycerol were discussed. A model which was capable of quantitatively reproducing the amplitudes, shapes and peak positions of observed dielectric holes was presented. The analysis showed that the frequency selective local heating of the modes of motion associated with the structural relaxation resulting from the dielectric loss fully accounted for the dielectric hole burning effects.

Original languageEnglish (US)
Pages (from-to)6150-6156
Number of pages7
JournalJournal of Chemical Physics
Volume119
Issue number12
DOIs
StatePublished - Sep 22 2003

Fingerprint

hole burning
Relaxation time
relaxation time
signatures
Structural relaxation
Dielectric relaxation
Dielectric losses
Glycerol
Specific heat
glycerols
dielectric loss
Heating
specific heat
heat
heating
Hot Temperature

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Dielectric hole burning : Signature of dielectric and thermal relaxation time heterogeneity. / Jeffrey, Kenneth R.; Richert, Ranko; Duvvuri, Kalyan.

In: Journal of Chemical Physics, Vol. 119, No. 12, 22.09.2003, p. 6150-6156.

Research output: Contribution to journalArticle

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