Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search

Fang Liu, Sule Ozev, Martin Brooke

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

With increasing uncertainties in the modeling and processing of semiconductor devices, it is essential that the sources of failures be identified once the devices are manufactured. In this paper, we present a methodology to diagnose the problems in broad-band amplifiers by determining the most important small signal parameters of the internal transistors. We use an evolutionary algorithm specifically designed to mimic the expected errors to ensure fast convergence to the correct solution. Sensitivity analysis is used to determine the set of the most impactful small signal parameters and to guide the evolutionary search. Experimental results indicate the proposed algorithm determines the parameters accurately and it scales well in terms of accuracy and computation time.

Original languageEnglish (US)
Title of host publicationIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
Pages641-647
Number of pages7
StatePublished - 2004
Externally publishedYes
EventICCAD-2004 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers - San Jose, CA, United States
Duration: Nov 7 2004Nov 11 2004

Other

OtherICCAD-2004 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
CountryUnited States
CitySan Jose, CA
Period11/7/0411/11/04

Fingerprint

Broadband amplifiers
Scattering parameters
Semiconductor devices
Evolutionary algorithms
Sensitivity analysis
Transistors
Processing
Uncertainty

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Liu, F., Ozev, S., & Brooke, M. (2004). Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search. In IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD (pp. 641-647). [8B.2]

Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search. / Liu, Fang; Ozev, Sule; Brooke, Martin.

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2004. p. 641-647 8B.2.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Liu, F, Ozev, S & Brooke, M 2004, Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search. in IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD., 8B.2, pp. 641-647, ICCAD-2004 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, San Jose, CA, United States, 11/7/04.
Liu F, Ozev S, Brooke M. Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search. In IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2004. p. 641-647. 8B.2
Liu, Fang ; Ozev, Sule ; Brooke, Martin. / Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search. IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2004. pp. 641-647
@inproceedings{85db5962e0d542bc9633f81b678d31ce,
title = "Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search",
abstract = "With increasing uncertainties in the modeling and processing of semiconductor devices, it is essential that the sources of failures be identified once the devices are manufactured. In this paper, we present a methodology to diagnose the problems in broad-band amplifiers by determining the most important small signal parameters of the internal transistors. We use an evolutionary algorithm specifically designed to mimic the expected errors to ensure fast convergence to the correct solution. Sensitivity analysis is used to determine the set of the most impactful small signal parameters and to guide the evolutionary search. Experimental results indicate the proposed algorithm determines the parameters accurately and it scales well in terms of accuracy and computation time.",
author = "Fang Liu and Sule Ozev and Martin Brooke",
year = "2004",
language = "English (US)",
pages = "641--647",
booktitle = "IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD",

}

TY - GEN

T1 - Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search

AU - Liu, Fang

AU - Ozev, Sule

AU - Brooke, Martin

PY - 2004

Y1 - 2004

N2 - With increasing uncertainties in the modeling and processing of semiconductor devices, it is essential that the sources of failures be identified once the devices are manufactured. In this paper, we present a methodology to diagnose the problems in broad-band amplifiers by determining the most important small signal parameters of the internal transistors. We use an evolutionary algorithm specifically designed to mimic the expected errors to ensure fast convergence to the correct solution. Sensitivity analysis is used to determine the set of the most impactful small signal parameters and to guide the evolutionary search. Experimental results indicate the proposed algorithm determines the parameters accurately and it scales well in terms of accuracy and computation time.

AB - With increasing uncertainties in the modeling and processing of semiconductor devices, it is essential that the sources of failures be identified once the devices are manufactured. In this paper, we present a methodology to diagnose the problems in broad-band amplifiers by determining the most important small signal parameters of the internal transistors. We use an evolutionary algorithm specifically designed to mimic the expected errors to ensure fast convergence to the correct solution. Sensitivity analysis is used to determine the set of the most impactful small signal parameters and to guide the evolutionary search. Experimental results indicate the proposed algorithm determines the parameters accurately and it scales well in terms of accuracy and computation time.

UR - http://www.scopus.com/inward/record.url?scp=16244408310&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=16244408310&partnerID=8YFLogxK

M3 - Conference contribution

SP - 641

EP - 647

BT - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

ER -