Diagnosis of assembly failures for system-in-package RF tuners

Erdem S. Erdogan, Sule Ozev, Philippe Cauvet

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

We present a diagnosis methodology for assembly failures in RF front-end circuits embedded in System-in-Package (SiP) designs. We focus on technologies where nonlinear components reside on several active dies and the linear components reside on a passive base. While there can be many pin connections between the base and the active die in these designs, there are only a few outside pins available. We present a systematic analysis technique to select viable test conditions to distinguish among the faults. Normal operation mode as well as non-functional mode test signals are used to increase the diagnostic resolution. We show that most assembly faults can be distinguished from one another using non-functional mode test signals on a generic LNA circuit. We also apply our technique to a commercial tuner for a subset of representative faults and reach the same conclusions.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems
Pages2286-2289
Number of pages4
DOIs
StatePublished - 2008
Externally publishedYes
Event2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 - Seattle, WA, United States
Duration: May 18 2008May 21 2008

Other

Other2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
CountryUnited States
CitySeattle, WA
Period5/18/085/21/08

Fingerprint

Tuners
Networks (circuits)
System-in-package

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Erdogan, E. S., Ozev, S., & Cauvet, P. (2008). Diagnosis of assembly failures for system-in-package RF tuners. In Proceedings - IEEE International Symposium on Circuits and Systems (pp. 2286-2289). [4541910] https://doi.org/10.1109/ISCAS.2008.4541910

Diagnosis of assembly failures for system-in-package RF tuners. / Erdogan, Erdem S.; Ozev, Sule; Cauvet, Philippe.

Proceedings - IEEE International Symposium on Circuits and Systems. 2008. p. 2286-2289 4541910.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Erdogan, ES, Ozev, S & Cauvet, P 2008, Diagnosis of assembly failures for system-in-package RF tuners. in Proceedings - IEEE International Symposium on Circuits and Systems., 4541910, pp. 2286-2289, 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008, Seattle, WA, United States, 5/18/08. https://doi.org/10.1109/ISCAS.2008.4541910
Erdogan ES, Ozev S, Cauvet P. Diagnosis of assembly failures for system-in-package RF tuners. In Proceedings - IEEE International Symposium on Circuits and Systems. 2008. p. 2286-2289. 4541910 https://doi.org/10.1109/ISCAS.2008.4541910
Erdogan, Erdem S. ; Ozev, Sule ; Cauvet, Philippe. / Diagnosis of assembly failures for system-in-package RF tuners. Proceedings - IEEE International Symposium on Circuits and Systems. 2008. pp. 2286-2289
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