Diagnosis of assembly failures for system-in-package RF tuners

Erdem S. Erdogan, Sule Ozev, Philippe Cauvet

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

We present a diagnosis methodology for assembly failures in RF front-end circuits embedded in System-in-Package (SiP) designs. We focus on technologies where nonlinear components reside on several active dies and the linear components reside on a passive base. While there can be many pin connections between the base and the active die in these designs, there are only a few outside pins available. We present a systematic analysis technique to select viable test conditions to distinguish among the faults. Normal operation mode as well as non-functional mode test signals are used to increase the diagnostic resolution. We show that most assembly faults can be distinguished from one another using non-functional mode test signals on a generic LNA circuit. We also apply our technique to a commercial tuner for a subset of representative faults and reach the same conclusions.

Original languageEnglish (US)
Title of host publication2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
Pages2286-2289
Number of pages4
DOIs
StatePublished - Sep 19 2008
Externally publishedYes
Event2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 - Seattle, WA, United States
Duration: May 18 2008May 21 2008

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Other

Other2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
CountryUnited States
CitySeattle, WA
Period5/18/085/21/08

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Erdogan, E. S., Ozev, S., & Cauvet, P. (2008). Diagnosis of assembly failures for system-in-package RF tuners. In 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 (pp. 2286-2289). [4541910] (Proceedings - IEEE International Symposium on Circuits and Systems). https://doi.org/10.1109/ISCAS.2008.4541910