Deviations from Vegard's law in semiconductor thin films measured with X-ray diffraction and Rutherford backscattering: The Ge1-ySny and Ge1-xSix cases

Chi Xu, Charutha L. Senaratne, Robert Culbertson, John Kouvetakis, Jose Menendez

Research output: Contribution to journal › Article › peer-review

39 Scopus citations

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Physics & Astronomy