Development of a new methodology to model the synergistic effects between TID and ASETs

Nicolas J.H. Roche, L. Dusseau, J. Boch, Y. Gonzalez Velo, J. R. Vaillé, F. Saigné, G. Auriel, B. Azais, S. P. Buchner, R. Marec, P. Calvel, F. Bezerra

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

A high level model is developed using circuit analysis to predict the synergy effect observed on a three stages operational amplifier. This model makes possible to explain and to predict the ASETs propagation in circuitry. The effect of total ionizing dose is taken into account by varying the model parameters using the monitoring of the usual supply current induced degradation of the operational amplifier.

Original languageEnglish (US)
Title of host publication2009 European Conference on Radiation and Its Effects on Components and Systems
Subtitle of host publication10th RADECS Conference, RADECS 2009
Pages171-178
Number of pages8
DOIs
StatePublished - 2009
Externally publishedYes
Event2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009 - Bruges, Belgium
Duration: Sep 14 2009Sep 18 2009

Publication series

NameProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Other

Other2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009
CountryBelgium
CityBruges
Period9/14/099/18/09

Keywords

  • Analog integrated circuits
  • Bipolar circuits
  • Integrated circuit modeling
  • Ionizing Dose
  • Single Event Transient
  • Transient propagation
  • Transient response

ASJC Scopus subject areas

  • Radiation
  • Electrical and Electronic Engineering

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