@inproceedings{86986e66222f4d1e8278227d0c1c226f,
title = "Development of a new methodology to model the synergistic effects between TID and ASETs",
abstract = "A high level model is developed using circuit analysis to predict the synergy effect observed on a three stages operational amplifier. This model makes possible to explain and to predict the ASETs propagation in circuitry. The effect of total ionizing dose is taken into account by varying the model parameters using the monitoring of the usual supply current induced degradation of the operational amplifier.",
keywords = "Analog integrated circuits, Bipolar circuits, Integrated circuit modeling, Ionizing Dose, Single Event Transient, Transient propagation, Transient response",
author = "Roche, {Nicolas J.H.} and L. Dusseau and J. Boch and Velo, {Y. Gonzalez} and Vaill{\'e}, {J. R.} and F. Saign{\'e} and G. Auriel and B. Azais and Buchner, {S. P.} and R. Marec and P. Calvel and F. Bezerra",
year = "2009",
doi = "10.1109/RADECS.2009.5994576",
language = "English (US)",
isbn = "9781457704932",
series = "Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS",
pages = "171--178",
booktitle = "2009 European Conference on Radiation and Its Effects on Components and Systems",
note = "2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009 ; Conference date: 14-09-2009 Through 18-09-2009",
}