Determination of transient stability constrained line flow limits: An application of linearized techniques for the transient energy function method

Vijay Vittal, Jolene Le Anne Gleason

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

An effort is made to determine how line flow changes affect the robustness of the system using the energy margin sensitivities to power generation shifts and power flow distribution factors. A method to obtain stability constrained line flow limits is proposed. The major difference between this research work and other research in transient energy function sensitivity techniques for line flow limits is that this research allows for line flow changes caused by unspecified machines. Previous research dealt with line flow limits due to a generation shift at a single specified machine. However, it is possible that a generation shift at another machine or combination of machines may consume the energy margin less quickly and thus result in large stability constrained transaction capability.

Original languageEnglish (US)
Title of host publicationProc Twenty First Ann North Am Power Symp
Editors Anon
PublisherPubl by IEEE
Pages142-150
Number of pages9
ISBN (Print)0818620056
StatePublished - Dec 1 1989
Externally publishedYes
EventProceedings of the Twenty First Annual North American Power Symposium - Rolla, MO, USA
Duration: Oct 9 1989Oct 10 1989

Publication series

NameProceedings of the Annual North American Power Symposium

Other

OtherProceedings of the Twenty First Annual North American Power Symposium
CityRolla, MO, USA
Period10/9/8910/10/89

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Vittal, V., & Gleason, J. L. A. (1989). Determination of transient stability constrained line flow limits: An application of linearized techniques for the transient energy function method. In Anon (Ed.), Proc Twenty First Ann North Am Power Symp (pp. 142-150). (Proceedings of the Annual North American Power Symposium). Publ by IEEE.