A technique is presented which enables the recovery of the probability distribution for single scattering from plural-scattering electron energy loss data. Neither the scattering parameter t/λ nor details of the component processes need be known. The computational method uses Fourier series in order to overcome a number of practical problems in the application of convolution series methods, to include instrumental effects and to permit the processing of data with large values of the scattering parameter. The effects of noise, specimen oxidation and the accuracy of the technique are considered.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Acoustics and Ultrasonics
- Surfaces, Coatings and Films