Determination of the atomic structure of inversion domain boundaries in α-GaN by transmission electron microscopy

D. Cherns, W. T. Young, M. Saunders, J. W. Steeds, F. A. Ponce, S. Nakamura

Research output: Contribution to journalArticle

45 Scopus citations


Transmission electron microscopy is used to investigate the structure of inversion domain boundaries in α-GaN (0001) films grown by metal-organic chemical vapour deposition on sapphire substrates. Convergent-beam electron diffraction is used to establish the existence of inversion domains with (1010) boundaries. Displacement fringes observed in two-beam images recorded from inclined inversion domain boundaries are compared with dynamical simulations. It is shown that the results are consistent with an atomic model in which fourfold bonding is preserved with all bonds being of the Ga-N type. The significance of the results for understanding the electronic properties of GaN is briefly discussed.

Original languageEnglish (US)
Pages (from-to)273-286
Number of pages14
JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Issue number1
StatePublished - Jan 1998
Externally publishedYes


ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Condensed Matter Physics
  • Physics and Astronomy (miscellaneous)
  • Metals and Alloys

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