Determination of structure factor phase invariants from non-systematic many-beam effects in convergent-beam patterns

R. Høier, J. M. Zuo, K. Marthinsen, John Spence

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

The determination of structure factor phase invariants and magnitudes from non-systematic many-beam effects in convergent-beam patterns is discussed. Non-centrosymmetric semiconductors are investigated with emphasis on the phase problem. Two-dimensional simulations using three or more beams show that a three-phase invariant may be determined from each of the numerous line intersections observed provided the three-beam coupling is non-negligible. The use of two-dimensional energy-filtered patterns for intensity registration is suggested, and an example using this technique is given.

Original languageEnglish (US)
Pages (from-to)25-30
Number of pages6
JournalUltramicroscopy
Volume26
Issue number1-2
DOIs
StatePublished - 1988

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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