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Determination of Minority Carrier Lifetime of Holes in Diamond p-i-n Diodes Using Reverse Recovery Method
Maitreya Dutta, Saptarshi Mandal, Raghuraj Hathwar, Alec M. Fischer, Franz A.M. Koeck, Robert Nemanich, Stephen Goodnick, Srabanti Chowdhury
- Physics
- Photonics Innovation, Center for (CPhI)
- QESST ERC Consortium
- Sustainability Initiative
- Nano-Electronics, Arizona Institute of (AINE)
- Computational Nanoscience, Center for (CCN)
- Knowledge Enterprise (KE)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- Materials Science and Engineering
- Adaptive Neural Systems, Center for (ANS)
- Single Molecule Biophysics, Center for (SMB)
- Engineering, Ira A. Fulton Schools of (IAFSE)
- Electrical Engineering
- Biodesign Institute
- Solid State Electronics Research Center (CSSER)
Research output: Contribution to journal › Article › peer-review
12
Scopus
citations