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Dive into the research topics of 'Determination of critical thickness for epitaxial ZnTe layers grown by molecular beam epitaxy on (211)B and (100) GaSb substrates'. Together they form a unique fingerprint.- Sort by
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J. Chai, O. C. Noriega, A. Dedigama, J. J. Kim, A. A. Savage, K. Doyle, C. Smith, N. Chau, J. Pena, J. H. Dinan, David Smith, T. H. Myers
Research output: Contribution to journal › Article › peer-review