Determination of critical thickness for epitaxial ZnTe layers grown by molecular beam epitaxy on (211)B and (100) GaSb substrates

J. Chai, O. C. Noriega, A. Dedigama, J. J. Kim, A. A. Savage, K. Doyle, C. Smith, N. Chau, J. Pena, J. H. Dinan, David Smith, T. H. Myers

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