Determination by electron holography of the electronic charge distribution at threading dislocations in epitaxial GaN

Engineering & Materials Science

• Electron holography 100%
• Edge dislocations 73%
• Screw dislocations 73%
• Dislocations (crystals) 70%
• Charge distribution 64%
• Charge density 62%
• Electronic properties 34%
• Electrostatics 23%
• Electrons 22%

Chemical Compounds

• Threading Dislocation 83%
• Edge Dislocation 75%
• Screw Dislocation 70%
• Charge Density 42%
• Electron Particle 24%
• Electrostatic Potential 23%
• Electronic Property 18%

Physics & Astronomy

• charge distribution 44%
• holography 43%
• electronics 23%
• screw dislocations 20%
• edge dislocations 19%
• electrons 18%
• electrostatics 6%
• radii 5%
• profiles 4%