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Design-time reliability enhancement using hotspot identification for RF circuits
Doohwang Chang, Jennifer Kitchen, Bertan Bakkaloglu, Sayfe Kiaei, Sule Ozev
- Connection One (C1)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- Embedded Systems, Consortium for (CES)
- Electrical Engineering
- Adaptive Neural Systems, Center for (ANS)
- Solid State Electronics Research Center (CSSER)
- International Development (ID)
- Sustainability Initiative
- Knowledge Enterprise (KE)
Research output: Contribution to journal › Article › peer-review
8
Scopus
citations