TY - GEN
T1 - Design sensitivities to variability
T2 - 15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002
AU - Cao, Y.
AU - Gupta, P.
AU - Kahng, A. B.
AU - Sylvester, D.
AU - Yang, J.
N1 - Publisher Copyright:
© 2002 IEEE.
PY - 2002
Y1 - 2002
N2 - We propose a new framework for assessing (1) the impact of process variation on circuit performance and product value, and (2) the respective returns on investment for alternative process improvements. Elements of our framework include accurate device models and circuit simulation, along with Monte-Carlo analyses, to estimate parametric yields. We evaluate the merits of taking into account such previously unconsidered phenomena as correlations among process parameters. We also evaluate the impact of process variation with respect to such relevant metrics as parametric yield at selling point, and amount of required design guardbanding. Our experimental results yield insights into the scaling of process variation impacts through the next two ITRS technology nodes.
AB - We propose a new framework for assessing (1) the impact of process variation on circuit performance and product value, and (2) the respective returns on investment for alternative process improvements. Elements of our framework include accurate device models and circuit simulation, along with Monte-Carlo analyses, to estimate parametric yields. We evaluate the merits of taking into account such previously unconsidered phenomena as correlations among process parameters. We also evaluate the impact of process variation with respect to such relevant metrics as parametric yield at selling point, and amount of required design guardbanding. Our experimental results yield insights into the scaling of process variation impacts through the next two ITRS technology nodes.
UR - http://www.scopus.com/inward/record.url?scp=84949480508&partnerID=8YFLogxK
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U2 - 10.1109/ASIC.2002.1158094
DO - 10.1109/ASIC.2002.1158094
M3 - Conference contribution
AN - SCOPUS:84949480508
T3 - Proceedings of the Annual IEEE International ASIC Conference and Exhibit
SP - 411
EP - 415
BT - Proceedings - 15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002
A2 - Chickanosky, John
A2 - Krishnamurthy, Ram K.
A2 - Mukund, P.R.
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 25 September 2002 through 28 September 2002
ER -