Design and optimization of strong Physical Unclonable Function (PUF) based on RRAM array

Yachuan Pang, Huaqiang Wu, Bin Gao, Rui Liu, Shan Wang, Shimeng Yu, An Chen, He Qian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Physical Unclonable Function (PUF) based on high-density RRAM array is suitable for hardware security applications. In this work, an RRAM-based strong PUF leveraging random resistance variation is experimentally demonstrated. The number of challenge response pairs increase significantly compared with the previous weak PUF design. The PUF reliability is optimized through extending the resistance distribution, and a novel multiple small SET operation method is utilized to achieve the above purpose. The experimental results show that the intra-HD (intra-chip Hamming distance) reduced from ∼8% to ∼3.5% after using the optimized method. The inter-HD (inter-chip Hamming distance) maintains close to the ideal value 50%.

Original languageEnglish (US)
Title of host publication2017 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509058051
DOIs
StatePublished - Jun 7 2017
Event2017 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2017 - Hsinchu, Taiwan, Province of China
Duration: Apr 24 2017Apr 27 2017

Publication series

Name2017 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2017

Other

Other2017 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2017
Country/TerritoryTaiwan, Province of China
CityHsinchu
Period4/24/174/27/17

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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