Design and optimization of a strong PUF exploiting sneak paths in resistive cross-point array

Rui Liu, Pai Yu Chen, Shimeng Yu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

In this paper, we propose a novel design of strong Physical Unclonable Function (PUF) leveraging the sneak paths in the resistive cross-point (X-point) array for device authentication. The entanglement of the sneak paths in the X-point array greatly enhances the entropy of the physical system, thereby increasing the space of challenge-response pairs (CRPs). Digital resistance distribution in X-point array is employed to eliminate the undesired collision or diffuseness when analog resistance distribution is used. The X-point PUF's characteristics are evaluated on the 128×128 cross-point arrays by SPICE simulation. The simulation results show that the on-state resistance (Ron) activity affects the PUF's performance and 4% is shown as an optimized design in terms of large reference current (Iref) tolerance range. In addition, the X-point PUF presents no correlation between challenges and responses, showing improved security.

Original languageEnglish (US)
Title of host publicationIEEE International Symposium on Circuits and Systems
Subtitle of host publicationFrom Dreams to Innovation, ISCAS 2017 - Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467368520
DOIs
StatePublished - Sep 25 2017
Event50th IEEE International Symposium on Circuits and Systems, ISCAS 2017 - Baltimore, United States
Duration: May 28 2017May 31 2017

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Other

Other50th IEEE International Symposium on Circuits and Systems, ISCAS 2017
Country/TerritoryUnited States
CityBaltimore
Period5/28/175/31/17

Keywords

  • PUF
  • cross-point array
  • hardware security
  • reliability
  • resistive memory
  • sneak path
  • uniqueness

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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