Delocalized secondary-electron generation studied by momentum-resolved coincidence-electron spectroscopy

Jeffery Drucker, M. R. Scheinfein

Research output: Contribution to journalArticle

12 Scopus citations

Abstract

The delocalization of the secondary-electron generation process is studied using momentum-resolved coincidence-electron spectroscopy in an ultrahigh-vacuum scanning transmission electron microscope. Secondary electrons are more efficiently produced by the decay of excitations resulting from large-momentum-transfer (spatially localized) inelastic scattering. The fraction of secondary electrons resulting from localized excitations can explain the high spatial resolution observed in secondary-electron microscopy images.

Original languageEnglish (US)
Pages (from-to)15973-15975
Number of pages3
JournalPhysical Review B
Volume47
Issue number23
DOIs
StatePublished - Jan 1 1993

ASJC Scopus subject areas

  • Condensed Matter Physics

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