Abstract
The delocalization of the secondary-electron generation process is studied using momentum-resolved coincidence-electron spectroscopy in an ultrahigh-vacuum scanning transmission electron microscope. Secondary electrons are more efficiently produced by the decay of excitations resulting from large-momentum-transfer (spatially localized) inelastic scattering. The fraction of secondary electrons resulting from localized excitations can explain the high spatial resolution observed in secondary-electron microscopy images.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 15973-15975 |
| Number of pages | 3 |
| Journal | Physical Review B |
| Volume | 47 |
| Issue number | 23 |
| DOIs | |
| State | Published - Jan 1 1993 |
ASJC Scopus subject areas
- Condensed Matter Physics