Delocalization corrections using a disordered structure for atom location by channelling-enhanced microanalysis in the Ni-Al system

Z. Horita; H. Kuninaka; T. Sano; M. Nemoto; John Spence

doi:10.1080/01418619308207168

Delocalization corrections using a disordered structure for atom location by channelling-enhanced microanalysis in the Ni-Al system

Z. Horita, H. Kuninaka, T. Sano, M. Nemoto, John Spence

Physics

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

A correction procedure for the delocalization effect when determining the site occupancy of an impurity element by atom location by channelling-enhanced microanalysis is proposed. The procedure utilizes a disordered structure with a composition similar to the ordered structure. Correction factors are derived by illuminating a sample with a disordered structure in the same orientation as for the ordered structure. The correction procedure is applied to a determination of the Ti occupancy in a Ni₃Al intermetallic compound.

Original language	English (US)
Pages (from-to)	425-432
Number of pages	8
Journal	Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume	67
Issue number	2
DOIs	https://doi.org/10.1080/01418619308207168
State	Published - Feb 1993

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
General Materials Science
Condensed Matter Physics
Physics and Astronomy (miscellaneous)
Metals and Alloys

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10.1080/01418619308207168

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Delocalization corrections using a disordered structure for atom location by channelling-enhanced microanalysis in the Ni-Al system. / Horita, Z.; Kuninaka, H.; Sano, T. et al.
In: Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, Vol. 67, No. 2, 02.1993, p. 425-432.

Research output: Contribution to journal › Article › peer-review

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title = "Delocalization corrections using a disordered structure for atom location by channelling-enhanced microanalysis in the Ni-Al system",

abstract = "A correction procedure for the delocalization effect when determining the site occupancy of an impurity element by atom location by channelling-enhanced microanalysis is proposed. The procedure utilizes a disordered structure with a composition similar to the ordered structure. Correction factors are derived by illuminating a sample with a disordered structure in the same orientation as for the ordered structure. The correction procedure is applied to a determination of the Ti occupancy in a Ni3Al intermetallic compound.",

author = "Z. Horita and H. Kuninaka and T. Sano and M. Nemoto and John Spence",

note = "Funding Information: We are grateful to Mr Y. Honda for helpful cooperation at an initial stage of this study. An analytical electron microscope (JEM-2000FX) in the High-Voltage Electron Microscopy Laboratory of Kyushu University was used to obtain the X-ray data. This work was supported in part by Grant-in-Aid for Scientific Research (C) No. 03650580 from the Ministry of Education, Science and Culture of Japan and in part by the National Science Foundation under Grant No. DMR-9015867.",

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AU - Nemoto, M.

AU - Spence, John

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Delocalization corrections using a disordered structure for atom location by channelling-enhanced microanalysis in the Ni-Al system

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