Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts

Joseph Karas; Lynne Michaelson; Krystal Munoz; Jim Rand; Stuart Bowden

doi:10.1109/PVSC.2018.8547900

Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts

Joseph Karas, Lynne Michaelson, Krystal Munoz, Jim Rand, Stuart Bowden

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

The reliability and degradation of copper contacts is a topic of concern as copper is considered as an alternative to screenprinted silver. In this work, we perform reliability testing of modules of crystalline silicon (c-Si) solar cells with nickelcopper (Ni-Cu) plated contacts, including both traditional fullarea back surface field (BSF) and local-area passivated and rear emitter (PERC) cells. In particular, we have demonstrated two separate manners in which Cu-plated cells show greater susceptibility to degradation than analogous Ag-screenprinted cells. We expose modules to environmental stress using climate chambers, and light soak modules under natural sunlight. In both circumstances we have demonstrated separate modes in which Cu-plated cells show greater susceptibility to degradation than analogous Ag-screenprinted cells.

Original language	English (US)
Title of host publication	2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	3938-3942
Number of pages	5
ISBN (Electronic)	9781538685297
DOIs	https://doi.org/10.1109/PVSC.2018.8547900
State	Published - Nov 26 2018
Event	7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States Duration: Jun 10 2018 → Jun 15 2018

Publication series

Name	2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

Other

Other	7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
Country/Territory	United States
City	Waikoloa Village
Period	6/10/18 → 6/15/18

Keywords

Copper
degradation
light-induced degradation
plating
reliability
silicon

ASJC Scopus subject areas

Energy Engineering and Power Technology
Renewable Energy, Sustainability and the Environment
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/PVSC.2018.8547900

Cite this

Karas, J., Michaelson, L., Munoz, K., Rand, J., & Bowden, S. (2018). Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC (pp. 3938-3942). Article 8547900 (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2018.8547900

Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts. / Karas, Joseph; Michaelson, Lynne; Munoz, Krystal et al.
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc., 2018. p. 3938-3942 8547900 (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Karas, J, Michaelson, L, Munoz, K, Rand, J & Bowden, S 2018, Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts. in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC., 8547900, 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, Institute of Electrical and Electronics Engineers Inc., pp. 3938-3942, 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018, Waikoloa Village, United States, 6/10/18. https://doi.org/10.1109/PVSC.2018.8547900

Karas J, Michaelson L, Munoz K, Rand J, Bowden S. Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc. 2018. p. 3938-3942. 8547900. (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC). doi: 10.1109/PVSC.2018.8547900

Karas, Joseph ; Michaelson, Lynne ; Munoz, Krystal et al. / Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts. 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 3938-3942 (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC).

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abstract = "The reliability and degradation of copper contacts is a topic of concern as copper is considered as an alternative to screenprinted silver. In this work, we perform reliability testing of modules of crystalline silicon (c-Si) solar cells with nickelcopper (Ni-Cu) plated contacts, including both traditional fullarea back surface field (BSF) and local-area passivated and rear emitter (PERC) cells. In particular, we have demonstrated two separate manners in which Cu-plated cells show greater susceptibility to degradation than analogous Ag-screenprinted cells. We expose modules to environmental stress using climate chambers, and light soak modules under natural sunlight. In both circumstances we have demonstrated separate modes in which Cu-plated cells show greater susceptibility to degradation than analogous Ag-screenprinted cells.",

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N1 - Funding Information: ACKNOWLEDGEMENT This material is based upon work supported by the U.S. Department of Energy’s Office of Energy Efficiency and Renewable Energy under the DuraMat program. It is also supported by SolMat2 program award DOE EERE DE-EE0006814 and by the Engineering Research Center Program of the National Science Foundation and the Office of Energy Efficiency and Renewable Energy of the Department of Energy under NSF Cooperative Agreement No. EECǦ1041895 Publisher Copyright: © 2018 IEEE.

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N2 - The reliability and degradation of copper contacts is a topic of concern as copper is considered as an alternative to screenprinted silver. In this work, we perform reliability testing of modules of crystalline silicon (c-Si) solar cells with nickelcopper (Ni-Cu) plated contacts, including both traditional fullarea back surface field (BSF) and local-area passivated and rear emitter (PERC) cells. In particular, we have demonstrated two separate manners in which Cu-plated cells show greater susceptibility to degradation than analogous Ag-screenprinted cells. We expose modules to environmental stress using climate chambers, and light soak modules under natural sunlight. In both circumstances we have demonstrated separate modes in which Cu-plated cells show greater susceptibility to degradation than analogous Ag-screenprinted cells.

AB - The reliability and degradation of copper contacts is a topic of concern as copper is considered as an alternative to screenprinted silver. In this work, we perform reliability testing of modules of crystalline silicon (c-Si) solar cells with nickelcopper (Ni-Cu) plated contacts, including both traditional fullarea back surface field (BSF) and local-area passivated and rear emitter (PERC) cells. In particular, we have demonstrated two separate manners in which Cu-plated cells show greater susceptibility to degradation than analogous Ag-screenprinted cells. We expose modules to environmental stress using climate chambers, and light soak modules under natural sunlight. In both circumstances we have demonstrated separate modes in which Cu-plated cells show greater susceptibility to degradation than analogous Ag-screenprinted cells.

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Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts

Abstract

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Keywords

ASJC Scopus subject areas

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