Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts

Joseph Karas, Lynne Michaelson, Krystal Munoz, Jim Rand, Stuart Bowden

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The reliability and degradation of copper contacts is a topic of concern as copper is considered as an alternative to screenprinted silver. In this work, we perform reliability testing of modules of crystalline silicon (c-Si) solar cells with nickelcopper (Ni-Cu) plated contacts, including both traditional fullarea back surface field (BSF) and local-area passivated and rear emitter (PERC) cells. In particular, we have demonstrated two separate manners in which Cu-plated cells show greater susceptibility to degradation than analogous Ag-screenprinted cells. We expose modules to environmental stress using climate chambers, and light soak modules under natural sunlight. In both circumstances we have demonstrated separate modes in which Cu-plated cells show greater susceptibility to degradation than analogous Ag-screenprinted cells.

Original languageEnglish (US)
Title of host publication2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3938-3942
Number of pages5
ISBN (Electronic)9781538685297
DOIs
StatePublished - Nov 26 2018
Event7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States
Duration: Jun 10 2018Jun 15 2018

Other

Other7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
CountryUnited States
CityWaikoloa Village
Period6/10/186/15/18

Fingerprint

Silicon solar cells
Nickel
Copper
Crystalline materials
Degradation
Silver
Testing

Keywords

  • Copper
  • degradation
  • light-induced degradation
  • plating
  • reliability
  • silicon

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Karas, J., Michaelson, L., Munoz, K., Rand, J., & Bowden, S. (2018). Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC (pp. 3938-3942). [8547900] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2018.8547900

Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts. / Karas, Joseph; Michaelson, Lynne; Munoz, Krystal; Rand, Jim; Bowden, Stuart.

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc., 2018. p. 3938-3942 8547900.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Karas, J, Michaelson, L, Munoz, K, Rand, J & Bowden, S 2018, Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts. in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC., 8547900, Institute of Electrical and Electronics Engineers Inc., pp. 3938-3942, 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018, Waikoloa Village, United States, 6/10/18. https://doi.org/10.1109/PVSC.2018.8547900
Karas J, Michaelson L, Munoz K, Rand J, Bowden S. Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc. 2018. p. 3938-3942. 8547900 https://doi.org/10.1109/PVSC.2018.8547900
Karas, Joseph ; Michaelson, Lynne ; Munoz, Krystal ; Rand, Jim ; Bowden, Stuart. / Degradation Studies Including Light-Induced Degradation of c-Si Solar Cells with Nickel-Copper Plated Contacts. 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 3938-3942
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