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Defect-oriented testing of RF circuits
Erkan Acar,
Sule Ozev
Research output
:
Contribution to journal
›
Article
›
peer-review
25
Scopus citations
Overview
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Engineering & Materials Science
Defects
100%
Networks (circuits)
80%
Testing
75%
Short circuit currents
56%
Costs
44%
Transistors
24%
Specifications
18%
Computer hardware
17%