Defect investigation of GaN thin films etched by photo-electrochemical and hot wet etching by atomic force and transmission electron microscopy

P. Visconti, K. M. Jones, M. A. Reshchikov, R. Cingolani, H. Morkoç, R. J. Molnar, David Smith

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Fingerprint

Dive into the research topics of 'Defect investigation of GaN thin films etched by photo-electrochemical and hot wet etching by atomic force and transmission electron microscopy'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds