Defect filter for alternate RF test

Haralampos G. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.

Original languageEnglish (US)
Title of host publication2010 15th IEEE European Test Symposium, ETS'10
Pages265-270
Number of pages6
DOIs
StatePublished - 2010
Event2010 15th IEEE European Test Symposium, ETS'10 - Prague, Czech Republic
Duration: May 24 2010May 28 2010

Other

Other2010 15th IEEE European Test Symposium, ETS'10
CountryCzech Republic
CityPrague
Period5/24/105/28/10

Fingerprint

Defects
Glossaries
Probability density function
Specifications
Testing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Stratigopoulos, H. G., Mir, S., Acar, E., & Ozev, S. (2010). Defect filter for alternate RF test. In 2010 15th IEEE European Test Symposium, ETS'10 (pp. 265-270). [5512726] https://doi.org/10.1109/ETSYM.2010.5512726

Defect filter for alternate RF test. / Stratigopoulos, Haralampos G.; Mir, Salvador; Acar, Erkan; Ozev, Sule.

2010 15th IEEE European Test Symposium, ETS'10. 2010. p. 265-270 5512726.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Stratigopoulos, HG, Mir, S, Acar, E & Ozev, S 2010, Defect filter for alternate RF test. in 2010 15th IEEE European Test Symposium, ETS'10., 5512726, pp. 265-270, 2010 15th IEEE European Test Symposium, ETS'10, Prague, Czech Republic, 5/24/10. https://doi.org/10.1109/ETSYM.2010.5512726
Stratigopoulos HG, Mir S, Acar E, Ozev S. Defect filter for alternate RF test. In 2010 15th IEEE European Test Symposium, ETS'10. 2010. p. 265-270. 5512726 https://doi.org/10.1109/ETSYM.2010.5512726
Stratigopoulos, Haralampos G. ; Mir, Salvador ; Acar, Erkan ; Ozev, Sule. / Defect filter for alternate RF test. 2010 15th IEEE European Test Symposium, ETS'10. 2010. pp. 265-270
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