TY - GEN
T1 - Defect filter for alternate RF test
AU - Stratigopoulos, Haralampos G.
AU - Mir, Salvador
AU - Acar, Erkan
AU - Ozev, Sule
PY - 2010
Y1 - 2010
N2 - Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.
AB - Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.
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U2 - 10.1109/ETSYM.2010.5512726
DO - 10.1109/ETSYM.2010.5512726
M3 - Conference contribution
AN - SCOPUS:78049290456
SN - 9781424458356
T3 - 2010 15th IEEE European Test Symposium, ETS'10
SP - 265
EP - 270
BT - 2010 15th IEEE European Test Symposium, ETS'10
T2 - 2010 15th IEEE European Test Symposium, ETS'10
Y2 - 24 May 2010 through 28 May 2010
ER -