Defect filter for alternate RF test

Haralampos G. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

41 Scopus citations

Abstract

Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.

Original languageEnglish (US)
Title of host publicationProceedings of the 14th IEEE European Test Symposium, ETS 2009
Pages101-106
Number of pages6
DOIs
StatePublished - Nov 18 2009
Event14th IEEE European Test Symposium, ETS 2009 - Sevilla, Spain
Duration: May 25 2009May 29 2009

Publication series

NameProceedings of the 14th IEEE European Test Symposium, ETS 2009

Other

Other14th IEEE European Test Symposium, ETS 2009
CountrySpain
CitySevilla
Period5/25/095/29/09

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Stratigopoulos, H. G., Mir, S., Acar, E., & Ozev, S. (2009). Defect filter for alternate RF test. In Proceedings of the 14th IEEE European Test Symposium, ETS 2009 (pp. 101-106). [5170466] (Proceedings of the 14th IEEE European Test Symposium, ETS 2009). https://doi.org/10.1109/ETS.2009.32