Engineering & Materials Science
Electron microscopy
100%
Characterization (materials science)
67%
Epilayers
65%
Defects
52%
Substrates
40%
Ellipsometry
32%
Growth temperature
31%
Infrared detectors
27%
Stacking faults
27%
Focal plane arrays
26%
Fourier transform infrared spectroscopy
23%
Precipitates
19%
Fluxes
15%
Physics & Astronomy
electron microscopy
66%
characterization
42%
defects
42%
focal plane devices
22%
infrared detectors
22%
craters
22%
crystal defects
19%
format
18%
ellipsometry
18%
infrared spectroscopy
17%
precipitates
16%
preparation
14%
requirements
13%
temperature
5%
Chemical Compounds
Electron Microscopy
67%
Alloy
53%
Stacking Fault
26%
Sample Preparation Method
23%
Ellipsometry
21%
Fourier Transform Infrared Spectroscopy
10%
Liquid Film
9%
Surface
6%
Application
6%