Defect-based test optimization for analog/RF circuits for near-zero DPPM applications

Ender Yilmaz, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

Analog circuits are often tested based on their specifications. While specification-based testing ensures the initial product quality, full testing is often not possible in high volume production. Moreover, even full specification-based testing cannot guarantee that the circuit does not contain any physical defects. Some application domains require near-zero defect levels independent of whether the specifications are met. In this work, we present a defect based test optimization method focusing on defective parts per million (DPPM) minimization. We extract potential defects through inductive fault analysis (IFA) and reduce the number of tests without degrading the test quality. In order to achieve near zero DPPM, we employ outlier analysis to identify defective circuits that cannot be identified using specification based methods. Simulation results on an LNA show that DPPM is reduced down to 0 at a cost of 0.2% yield loss with the proposed method.

Original languageEnglish (US)
Title of host publication2009 IEEE International Conference on Computer Design, ICCD 2009
Pages313-318
Number of pages6
DOIs
StatePublished - Dec 1 2009
Event2009 IEEE International Conference on Computer Design, ICCD 2009 - Lake Tahoe, CA, United States
Duration: Oct 4 2009Oct 7 2009

Publication series

NameProceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
ISSN (Print)1063-6404

Other

Other2009 IEEE International Conference on Computer Design, ICCD 2009
CountryUnited States
CityLake Tahoe, CA
Period10/4/0910/7/09

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ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Yilmaz, E., & Ozev, S. (2009). Defect-based test optimization for analog/RF circuits for near-zero DPPM applications. In 2009 IEEE International Conference on Computer Design, ICCD 2009 (pp. 313-318). [5413139] (Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors). https://doi.org/10.1109/ICCD.2009.5413139