Defect and safety inspection of 6 PV technologies from 56,000 modules representing 257,000 modules in 4 climatic regions of the United States

Sai Tatapudi, Cara Libby, Christopher Raupp, Devarajan Srinivasan, Joseph Kuitche, Bulent Bicer, Govindasamy Tamizhmani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Defect and safety inspections were performed on about 56,000 photovoltaic (PV) modules representing 257,000 modules of multiple technologies (mono-Si, poly-Si, a-Si, CdTe and CIGS) aged between 1.3 and 26 years, and operating in four climatic regions (hot-dry, temperate, cold-dry and hot-humid) of the United States. The number (or percentage) and types of defects and safety failures primarily depend on technology, design, installation, climate and age. The results presented in this paper will provide insights into the dominant types of defects and safety failures which are commonly found in multiple climates and that are specific to each climate.

Original languageEnglish (US)
Title of host publication2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-5
Number of pages5
ISBN (Electronic)9781509056057
DOIs
StatePublished - May 25 2018
Event44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
Duration: Jun 25 2017Jun 30 2017

Other

Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
CountryUnited States
CityWashington
Period6/25/176/30/17

Fingerprint

Inspection
Defects
Monocrystalline silicon
Polysilicon

Keywords

  • Amorphous silicon
  • CdTe
  • CIGS
  • Crystalline silicon
  • Performance defects
  • Safety failures
  • Visual inspection

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Tatapudi, S., Libby, C., Raupp, C., Srinivasan, D., Kuitche, J., Bicer, B., & Tamizhmani, G. (2018). Defect and safety inspection of 6 PV technologies from 56,000 modules representing 257,000 modules in 4 climatic regions of the United States. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (pp. 1-5). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2017.8366381

Defect and safety inspection of 6 PV technologies from 56,000 modules representing 257,000 modules in 4 climatic regions of the United States. / Tatapudi, Sai; Libby, Cara; Raupp, Christopher; Srinivasan, Devarajan; Kuitche, Joseph; Bicer, Bulent; Tamizhmani, Govindasamy.

2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2018. p. 1-5.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tatapudi, S, Libby, C, Raupp, C, Srinivasan, D, Kuitche, J, Bicer, B & Tamizhmani, G 2018, Defect and safety inspection of 6 PV technologies from 56,000 modules representing 257,000 modules in 4 climatic regions of the United States. in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., pp. 1-5, 44th IEEE Photovoltaic Specialist Conference, PVSC 2017, Washington, United States, 6/25/17. https://doi.org/10.1109/PVSC.2017.8366381
Tatapudi S, Libby C, Raupp C, Srinivasan D, Kuitche J, Bicer B et al. Defect and safety inspection of 6 PV technologies from 56,000 modules representing 257,000 modules in 4 climatic regions of the United States. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1-5 https://doi.org/10.1109/PVSC.2017.8366381
Tatapudi, Sai ; Libby, Cara ; Raupp, Christopher ; Srinivasan, Devarajan ; Kuitche, Joseph ; Bicer, Bulent ; Tamizhmani, Govindasamy. / Defect and safety inspection of 6 PV technologies from 56,000 modules representing 257,000 modules in 4 climatic regions of the United States. 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 1-5
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