Deadtime corrections for a pulse counting system in electron energy loss spectroscopy

S. C. Cheng, Peter Crozier, R. F. Egerton

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We have measured the relationship between the input and output pulse rates for an EELS pulse counting system. Two simple formulae for predicting the behaviour of such a system are compared with the data. One is for a system which has extendible deadtime. The other is for the counting system which has non‐extendible deadtime. The latter provides agreement with our experimental results over the range 0–20 MHz. 1987 Blackwell Science Ltd

Original languageEnglish (US)
Pages (from-to)285-288
Number of pages4
JournalJournal of Microscopy
Volume148
Issue number3
DOIs
StatePublished - 1987
Externally publishedYes

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Electron Energy-Loss Spectroscopy
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Keywords

  • deadtime
  • EELS
  • electron microscopy
  • extendible
  • non‐extendible
  • Poisson distribution
  • Pulse counting

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology

Cite this

Deadtime corrections for a pulse counting system in electron energy loss spectroscopy. / Cheng, S. C.; Crozier, Peter; Egerton, R. F.

In: Journal of Microscopy, Vol. 148, No. 3, 1987, p. 285-288.

Research output: Contribution to journalArticle

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