D-optimal reliability test design for two-stress accelerated life tests

Huairui Guo, Rong Pan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

Abstract

Multiple-stress accelerated life tests (ALTs) are often employed for reliability testing of electronic parts. It is important to derive the optimal designs for these tests. However, most of the existing literature on experimental design of ALTs discusses only single-stress tests. In this paper we formulate the D-optimal design for two-stress ALTs with log-normal failure time distribution. It is shown that an efficient testing plan can be obtained with required estimation precision. ALT experimental designs for both completed failure time data and time censored data are discussed.

Original languageEnglish (US)
Title of host publicationIEEM 2007
Subtitle of host publication2007 IEEE International Conference on Industrial Engineering and Engineering Management
Pages1236-1240
Number of pages5
DOIs
StatePublished - Dec 1 2007
Event2007 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2007 - , Singapore
Duration: Dec 2 2007Dec 4 2007

Publication series

NameIEEM 2007: 2007 IEEE International Conference on Industrial Engineering and Engineering Management

Other

Other2007 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2007
CountrySingapore
Period12/2/0712/4/07

Keywords

  • Accelerated life testing
  • D-optimality
  • Design of experiments
  • Multiple stresses

ASJC Scopus subject areas

  • Strategy and Management
  • Industrial and Manufacturing Engineering

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