TY - GEN
T1 - D-optimal reliability test design for two-stress accelerated life tests
AU - Guo, Huairui
AU - Pan, Rong
PY - 2007/12/1
Y1 - 2007/12/1
N2 - Multiple-stress accelerated life tests (ALTs) are often employed for reliability testing of electronic parts. It is important to derive the optimal designs for these tests. However, most of the existing literature on experimental design of ALTs discusses only single-stress tests. In this paper we formulate the D-optimal design for two-stress ALTs with log-normal failure time distribution. It is shown that an efficient testing plan can be obtained with required estimation precision. ALT experimental designs for both completed failure time data and time censored data are discussed.
AB - Multiple-stress accelerated life tests (ALTs) are often employed for reliability testing of electronic parts. It is important to derive the optimal designs for these tests. However, most of the existing literature on experimental design of ALTs discusses only single-stress tests. In this paper we formulate the D-optimal design for two-stress ALTs with log-normal failure time distribution. It is shown that an efficient testing plan can be obtained with required estimation precision. ALT experimental designs for both completed failure time data and time censored data are discussed.
KW - Accelerated life testing
KW - D-optimality
KW - Design of experiments
KW - Multiple stresses
UR - http://www.scopus.com/inward/record.url?scp=40649095019&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=40649095019&partnerID=8YFLogxK
U2 - 10.1109/IEEM.2007.4419389
DO - 10.1109/IEEM.2007.4419389
M3 - Conference contribution
AN - SCOPUS:40649095019
SN - 1424415292
SN - 9781424415298
T3 - IEEM 2007: 2007 IEEE International Conference on Industrial Engineering and Engineering Management
SP - 1236
EP - 1240
BT - IEEM 2007
T2 - 2007 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2007
Y2 - 2 December 2007 through 4 December 2007
ER -