Cross-Sectional Characterization of Defects in GaN MQW LEDs

A. Boley; I. S T Tsong; David Smith

doi:10.1017/S1431927612010938

Cross-Sectional Characterization of Defects in GaN MQW LEDs

A. Boley, I. S T Tsong, David Smith

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1816-1817
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612010938
State	Published - Jul 2012

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927612010938

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title = "Cross-Sectional Characterization of Defects in GaN MQW LEDs",

author = "A. Boley and Tsong, {I. S T} and David Smith",

year = "2012",

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volume = "18",

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journal = "Microscopy and Microanalysis",

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AU - Boley, A.

AU - Tsong, I. S T

AU - Smith, David

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VL - 18

SP - 1816

EP - 1817

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Cross-Sectional Characterization of Defects in GaN MQW LEDs

ASJC Scopus subject areas

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