Critical film properties for epitaxy

G. J. Dienes, Karl Sieradzki, A. Paskin, Behzad Massoumzadeh

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The conditions for overlayer coherency were investigated, by means of molecular dynamic simulations, for two-dimensional triangular Lennard-Jones solids. Up to a certain critical misfit, i.e. difference in the film-substrate lattice parameters, the film remains coherent and in a state of homogeneous strain parallel to the interface, in agreement with continuum calculations based on energy criteria. However, contrary to the predictions of such theories, the critical misfit quickly saturates as a function of film thickness. Further, the generation of misfit dislocations was favored by reducing the film-substrate bonding parameter but inhibited by an increase in this parameter. These factors indicate that in our overlayer-substrate system the occurrence of misfit dislocations is better described by a critical local force rather than a critical energy criterion.

Original languageEnglish (US)
Pages (from-to)273-289
Number of pages17
JournalSurface Science
Volume144
Issue number1
DOIs
StatePublished - Aug 2 1984
Externally publishedYes

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Epitaxial growth
epitaxy
Dislocations (crystals)
Substrates
Lattice constants
Film thickness
Molecular dynamics
lattice parameters
film thickness
occurrences
molecular dynamics
continuums
energy
Computer simulation
predictions
simulation

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Dienes, G. J., Sieradzki, K., Paskin, A., & Massoumzadeh, B. (1984). Critical film properties for epitaxy. Surface Science, 144(1), 273-289. https://doi.org/10.1016/0039-6028(84)90721-0

Critical film properties for epitaxy. / Dienes, G. J.; Sieradzki, Karl; Paskin, A.; Massoumzadeh, Behzad.

In: Surface Science, Vol. 144, No. 1, 02.08.1984, p. 273-289.

Research output: Contribution to journalArticle

Dienes, GJ, Sieradzki, K, Paskin, A & Massoumzadeh, B 1984, 'Critical film properties for epitaxy', Surface Science, vol. 144, no. 1, pp. 273-289. https://doi.org/10.1016/0039-6028(84)90721-0
Dienes, G. J. ; Sieradzki, Karl ; Paskin, A. ; Massoumzadeh, Behzad. / Critical film properties for epitaxy. In: Surface Science. 1984 ; Vol. 144, No. 1. pp. 273-289.
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