Coverage-based testing on embedded systems

X. Wu, J. Jenny Li, D. Weiss, Yann-Hang Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

One major issue of code coverage testing is the overhead imposed by program instrumentation, which inserts probes into the program to monitor its execution. In real-time systems, the overhead may alter the program execution behavior or impact its performance due to its strict requirement on timing. Coverage testing is even harder on embedded systems because of their critical and limited memory and CPU resources. This paper describes a case study of a coverage-based testing method for embedded system software focusing on minimizing instrumentation overhead. We ported a code coverage-based test tool to an in-house embedded system, IP phone. In our initial experiments, we found that this tool didn't affect the behavior of the program under test.

Original languageEnglish (US)
Title of host publicationProceedings - International Conference on Software Engineering
DOIs
StatePublished - 2007
Event29th International Conference on Software Engineering, ICSE'07 - 2nd International Workshop on Automation of Software Test, AST'07 - Minneapolis, MN, United States
Duration: May 20 2007May 26 2007

Other

Other29th International Conference on Software Engineering, ICSE'07 - 2nd International Workshop on Automation of Software Test, AST'07
CountryUnited States
CityMinneapolis, MN
Period5/20/075/26/07

Fingerprint

Embedded systems
Testing
Codes (standards)
Computer monitors
Real time systems
Program processors
Data storage equipment
Experiments

ASJC Scopus subject areas

  • Software

Cite this

Wu, X., Li, J. J., Weiss, D., & Lee, Y-H. (2007). Coverage-based testing on embedded systems. In Proceedings - International Conference on Software Engineering [4296718] https://doi.org/10.1109/AST.2007.8

Coverage-based testing on embedded systems. / Wu, X.; Li, J. Jenny; Weiss, D.; Lee, Yann-Hang.

Proceedings - International Conference on Software Engineering. 2007. 4296718.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Wu, X, Li, JJ, Weiss, D & Lee, Y-H 2007, Coverage-based testing on embedded systems. in Proceedings - International Conference on Software Engineering., 4296718, 29th International Conference on Software Engineering, ICSE'07 - 2nd International Workshop on Automation of Software Test, AST'07, Minneapolis, MN, United States, 5/20/07. https://doi.org/10.1109/AST.2007.8
Wu X, Li JJ, Weiss D, Lee Y-H. Coverage-based testing on embedded systems. In Proceedings - International Conference on Software Engineering. 2007. 4296718 https://doi.org/10.1109/AST.2007.8
Wu, X. ; Li, J. Jenny ; Weiss, D. ; Lee, Yann-Hang. / Coverage-based testing on embedded systems. Proceedings - International Conference on Software Engineering. 2007.
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