Coverage-based testing on embedded systems

X. Wu, J. Jenny Li, D. Weiss, Yann-Hang Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

One major issue of code coverage testing is the overhead imposed by program instrumentation, which inserts probes into the program to monitor its execution. In real-time systems, the overhead may alter the program execution behavior or impact its performance due to its strict requirement on timing. Coverage testing is even harder on embedded systems because of their critical and limited memory and CPU resources. This paper describes a case study of a coverage-based testing method for embedded system software focusing on minimizing instrumentation overhead. We ported a code coverage-based test tool to an in-house embedded system, IP phone. In our initial experiments, we found that this tool didn't affect the behavior of the program under test.

Original languageEnglish (US)
Title of host publication29th International Conference on Software Engineering, ICSE'07 - 2nd International Workshop on Automation of Software Test, AST'07
DOIs
StatePublished - Dec 1 2007
Event29th International Conference on Software Engineering, ICSE'07 - 2nd International Workshop on Automation of Software Test, AST'07 - Minneapolis, MN, United States
Duration: May 20 2007May 26 2007

Publication series

NameProceedings - International Conference on Software Engineering
ISSN (Print)0270-5257

Other

Other29th International Conference on Software Engineering, ICSE'07 - 2nd International Workshop on Automation of Software Test, AST'07
CountryUnited States
CityMinneapolis, MN
Period5/20/075/26/07

ASJC Scopus subject areas

  • Software

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  • Cite this

    Wu, X., Li, J. J., Weiss, D., & Lee, Y-H. (2007). Coverage-based testing on embedded systems. In 29th International Conference on Software Engineering, ICSE'07 - 2nd International Workshop on Automation of Software Test, AST'07 [4296718] (Proceedings - International Conference on Software Engineering). https://doi.org/10.1109/AST.2007.8